Benjamin D. Bunday

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Schenectady, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REDUCING CHARGE IN CRITICAL DIMENSION-SCANNING ELECTRON...
- Publication number 20170040228
- Publication date Feb 9, 2017
- The Research Foundation for the State University of New York
- Melvin W. Montgomery
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCING CHARGE IN CRITICAL DIMENSION-SCANNING ELECTRON...
- Publication number 20140206112
- Publication date Jul 24, 2014
- SEMATECH, INC.
- MELVIN WARREN MONTGOMERY
- H01 - BASIC ELECTRIC ELEMENTS