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Benjamin HARKE
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Gottingen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method of aligning a laser-scanning fluorescence microscope and las...
Patent number
11,131,630
Issue date
Sep 28, 2021
ABBERIOR INSTRUMENTS GMBH
Joern Heine
G02 - OPTICS
Information
Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
Patent number
10,488,342
Issue date
Nov 26, 2019
ABBERIOR INSTRUMENTS GMBH
Andreas Schoenle
G01 - MEASURING TESTING
Information
Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
Patent number
10,429,305
Issue date
Oct 1, 2019
ABBERIOR INSTRUMENTS GMBH
Andreas Schoenle
G02 - OPTICS
Information
Patent Grant
Method of using a high resolution laser scanning microscope and hig...
Patent number
10,386,621
Issue date
Aug 20, 2019
ABBERIOR INSTRUMENTS GMBH
Benjamin Harke
G01 - MEASURING TESTING
Information
Patent Grant
Stimulated emission-depletion (STED) microscopy based on time gatin...
Patent number
9,772,285
Issue date
Sep 26, 2017
Fondazione Istituto Italiano di Tecnologia
Giuseppe Vicidomini
G01 - MEASURING TESTING
Information
Patent Grant
Device for separately modulating the wave fronts of two components...
Patent number
9,632,297
Issue date
Apr 25, 2017
ABBERIOR INSTRUMENTS GMBH
Matthias Reuss
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...
Publication number
20240085680
Publication date
Mar 14, 2024
Abberior Instruments GmbH
Roman SCHMIDT
G02 - OPTICS
Information
Patent Application
METHOD AND MICROSCOPE FOR RECORDING TRAJECTORIES OF INDIVIDUAL PART...
Publication number
20240035950
Publication date
Feb 1, 2024
Benjamin HARKE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...
Publication number
20230384223
Publication date
Nov 30, 2023
Abberior Instruments GmbH
Benjamin HARKE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR LIGHT-MICROSCOPIC MULTICSCALE RECORDING O...
Publication number
20230384224
Publication date
Nov 30, 2023
Gerald DONNERT
G01 - MEASURING TESTING
Information
Patent Application
METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REF...
Publication number
20230375473
Publication date
Nov 23, 2023
Abberior Instruments GmbH
Benjamin HARKE
G02 - OPTICS
Information
Patent Application
METHOD AND DEVICE FOR CAPTURING NANOSCOPIC IMAGES OF SAMPLES DYED W...
Publication number
20230296520
Publication date
Sep 21, 2023
Abberior Instruments GmbH
Benjamin HARKE
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...
Publication number
20230003651
Publication date
Jan 5, 2023
Abberior Instruments GmbH
Benjamin HARKE
G01 - MEASURING TESTING
Information
Patent Application
Method and device for illuminating a sample in a microscope in points
Publication number
20220057615
Publication date
Feb 24, 2022
Abberior Instruments GmbH
Benjamin HARKE
G02 - OPTICS
Information
Patent Application
Method of Aligning a Laser-Scanning Fluorescence Microscope and Las...
Publication number
20190195800
Publication date
Jun 27, 2019
Abberior Instruments GmbH
Joern Heine
G02 - OPTICS
Information
Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
Publication number
20190056327
Publication date
Feb 21, 2019
Abberior Instruments GmbH
Andreas Schoenle
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
Publication number
20180238804
Publication date
Aug 23, 2018
Abberior Instruments GmbH
Andreas Schoenle
G02 - OPTICS
Information
Patent Application
METHOD OF USING A HIGH RESOLUTION LASER SCANNING MICROSCOPE AND HIG...
Publication number
20170212340
Publication date
Jul 27, 2017
Abberior Instruments GmbH
Benjamin Harke
G02 - OPTICS
Information
Patent Application
DEVICE FOR SEPARATELY MODULATING THE WAVE FRONTS OF TWO COMPONENTS...
Publication number
20170123197
Publication date
May 4, 2017
Abberior Instruments GmbH
Matthias Reuss
G02 - OPTICS
Information
Patent Application
STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATIN...
Publication number
20160187259
Publication date
Jun 30, 2016
Fondazione Istituto Italiano Di Tecnologia
Giuseppe VICIDOMINI
G01 - MEASURING TESTING