Benjamin HARKE

Person

Gottingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and light microscope for a high-resolution examination of a...
- Patent number 12,055,728
- Issue date Aug 6, 2024
- ABBERIOR INSTRUMENTS GMBH
- Roman Schmidt
- G02 - OPTICS
Information Patent Grant
Method of aligning a laser-scanning fluorescence microscope and las...
- Patent number 11,131,630
- Issue date Sep 28, 2021
- ABBERIOR INSTRUMENTS GMBH
- Joern Heine
- G02 - OPTICS
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,488,342
- Issue date Nov 26, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,429,305
- Issue date Oct 1, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Grant
Method of using a high resolution laser scanning microscope and hig...
- Patent number 10,386,621
- Issue date Aug 20, 2019
- ABBERIOR INSTRUMENTS GMBH
- Benjamin Harke
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated emission-depletion (STED) microscopy based on time gatin...
- Patent number 9,772,285
- Issue date Sep 26, 2017
- Fondazione Istituto Italiano di Tecnologia
- Giuseppe Vicidomini
- G01 - MEASURING TESTING
Information Patent Grant
Device for separately modulating the wave fronts of two components...
- Patent number 9,632,297
- Issue date Apr 25, 2017
- ABBERIOR INSTRUMENTS GMBH
- Matthias Reuss
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
LIGHT MODULATION DEVICE FOR A MICROSCOPE, MICROSCOPE AND METHOD FOR...
- Publication number 20240248291
- Publication date Jul 25, 2024
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...
- Publication number 20240085680
- Publication date Mar 14, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR RECORDING TRAJECTORIES OF INDIVIDUAL PART...
- Publication number 20240035950
- Publication date Feb 1, 2024
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...
- Publication number 20230384223
- Publication date Nov 30, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR LIGHT-MICROSCOPIC MULTICSCALE RECORDING O...
- Publication number 20230384224
- Publication date Nov 30, 2023
- Gerald DONNERT
- G01 - MEASURING TESTING
Information Patent Application
METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REF...
- Publication number 20230375473
- Publication date Nov 23, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
METHOD AND DEVICE FOR CAPTURING NANOSCOPIC IMAGES OF SAMPLES DYED W...
- Publication number 20230296520
- Publication date Sep 21, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...
- Publication number 20230003651
- Publication date Jan 5, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
Method and device for illuminating a sample in a microscope in points
- Publication number 20220057615
- Publication date Feb 24, 2022
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
Method of Aligning a Laser-Scanning Fluorescence Microscope and Las...
- Publication number 20190195800
- Publication date Jun 27, 2019
- Abberior Instruments GmbH
- Joern Heine
- G02 - OPTICS
Information Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
- Publication number 20190056327
- Publication date Feb 21, 2019
- Abberior Instruments GmbH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...
- Publication number 20180238804
- Publication date Aug 23, 2018
- Abberior Instruments GmbH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Application
METHOD OF USING A HIGH RESOLUTION LASER SCANNING MICROSCOPE AND HIG...
- Publication number 20170212340
- Publication date Jul 27, 2017
- Abberior Instruments GmbH
- Benjamin Harke
- G02 - OPTICS
Information Patent Application
DEVICE FOR SEPARATELY MODULATING THE WAVE FRONTS OF TWO COMPONENTS...
- Publication number 20170123197
- Publication date May 4, 2017
- Abberior Instruments GmbH
- Matthias Reuss
- G02 - OPTICS
Information Patent Application
STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATIN...
- Publication number 20160187259
- Publication date Jun 30, 2016
- Fondazione Istituto Italiano Di Tecnologia
- Giuseppe VICIDOMINI
- G01 - MEASURING TESTING

Benjamin HARKE

Person

Patents Grantslast 30 patents

Method and light microscope for a high-resolution examination of a...

Method of aligning a laser-scanning fluorescence microscope and las...

Methods of high-resolution imaging a structure of a sample, the str...

Methods of high-resolution imaging a structure of a sample, the str...

Method of using a high resolution laser scanning microscope and hig...

Stimulated emission-depletion (STED) microscopy based on time gatin...

Device for separately modulating the wave fronts of two components...

Patents Applicationslast 30 patents

LIGHT MODULATION DEVICE FOR A MICROSCOPE, MICROSCOPE AND METHOD FOR...

METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...

METHOD AND MICROSCOPE FOR RECORDING TRAJECTORIES OF INDIVIDUAL PART...

METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...

METHODS AND APPARATUS FOR LIGHT-MICROSCOPIC MULTICSCALE RECORDING O...

METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REF...

METHOD AND DEVICE FOR CAPTURING NANOSCOPIC IMAGES OF SAMPLES DYED W...

METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...

Method and device for illuminating a sample in a microscope in points

Method of Aligning a Laser-Scanning Fluorescence Microscope and Las...

METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...

METHODS OF HIGH-RESOLUTION IMAGING A STRUCTURE OF A SAMPLE, THE STR...

METHOD OF USING A HIGH RESOLUTION LASER SCANNING MICROSCOPE AND HIG...

DEVICE FOR SEPARATELY MODULATING THE WAVE FRONTS OF TWO COMPONENTS...

STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATIN...