San Diego, CA, US
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Patent Grant
United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
G01 - MEASURING TESTING
Information
Patent Grant
United States of America as by the Secretary of the Navy
Sergio A. Montoya
G01 - MEASURING TESTING
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Sergio A Montoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
B82 - NANO-TECHNOLOGY
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Patent Grant
United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Stephanie Claussen
G01 - MEASURING TESTING
Information
Patent Grant
United States of America as represented by Secretary of the Navy
Benjamin J Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
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Patent Grant
United States of America as represented by Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
B82 - NANO-TECHNOLOGY
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Susan Anne Elizabeth Berggren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Benjamin J. Taylor
G02 - OPTICS
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by the Sercretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A Montoya
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
BENJAMIN J. TAYLOR
B82 - NANO-TECHNOLOGY
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Patent Application
The United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
United States Governmnet as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America, as represented by the Secretary of the Navy
BENJAMIN J. TAYLOR
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by Secretary of the Navy
Stephanie Claussen
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
