Benjamin Kaczer

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Complexity-reduced simulation of circuit reliability
- Patent number 11,704,462
- Issue date Jul 18, 2023
- Imec VZW
- Pieter Weckx
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
PMOS transistor including low thermal-budget gate stack
- Patent number 11,282,837
- Issue date Mar 22, 2022
- Imec VZW
- Jacopo Franco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Breakdown-based physical unclonable function
- Patent number 10,469,083
- Issue date Nov 5, 2019
- Imec VZW
- Erik Bury
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for enhancing the reliability of a P-channel semiconductor d...
- Patent number 8,062,962
- Issue date Nov 22, 2011
- IMEC
- Benjamin Kaczer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PMOS TRANSISTOR INCLUDING LOW THERMAL-BUDGET GATE STACK
- Publication number 20200176446
- Publication date Jun 4, 2020
- IMEC vzw
- Jacopo Franco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEXITY-REDUCED SIMULATION OF CIRCUIT RELIABILITY
- Publication number 20200089829
- Publication date Mar 19, 2020
- IMEC vzw
- Pieter Weckx
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BREAKDOWN-BASED PHYSICAL UNCLONABLE FUNCTION
- Publication number 20180013431
- Publication date Jan 11, 2018
- IMEC vzw
- Erik Bury
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEXITY-REDUCED SIMULATION OF CIRCUIT RELIABILITY
- Publication number 20160283629
- Publication date Sep 29, 2016
- IMEC vzw
- Pieter Weckx
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ENHANCING THE RELIABILITY OF A P-CHANNEL SEMICONDUCTOR D...
- Publication number 20110084309
- Publication date Apr 14, 2011
- IMEC
- Benjamin Kaczer
- H01 - BASIC ELECTRIC ELEMENTS