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Benjamin KNIGHT
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Shelburne, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Universal multidetection system for microplates
Patent number
10,072,982
Issue date
Sep 11, 2018
BIOTEK INSTRUMENTS, INC.
Oleg Zimenkov
G01 - MEASURING TESTING
Information
Patent Grant
Autofocus algorithm for microscopy system based on cross-correlation
Patent number
10,025,084
Issue date
Jul 17, 2018
BIOTEK INSTRUMENTS, INC.
Ben Norris
G02 - OPTICS
Information
Patent Grant
Autofocus for imaging system
Patent number
9,772,540
Issue date
Sep 26, 2017
Bio-Tek Instruments, Inc.
Ben Norris
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Universal multidetection system for microplates
Patent number
9,557,217
Issue date
Jan 31, 2017
BTI Holdings, Inc.
Oleg Zimenkov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
UNIVERSAL MULTI-DETECTION SYSTEM FOR MICROPLATES WITH CONFOCAL IMAGING
Publication number
20240003810
Publication date
Jan 4, 2024
Agilent Technologies, Inc.
Ross Marcel PIETTE
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL MULTIDETECTION SYSTEM FOR MICROPLATES
Publication number
20170108438
Publication date
Apr 20, 2017
BTI HOLDINGS, INC.
Oleg ZIMENKOV
G01 - MEASURING TESTING
Information
Patent Application
AUTOFOCUS FOR IMAGING SYSTEM
Publication number
20170013186
Publication date
Jan 12, 2017
BIO-TEK INSTRUMENTS, INC.
Ben NORRIS
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
AUTOFOCUS ALGORITHM FOR MICROSCOPY SYSTEM BASED ON CROSS-CORRELATION
Publication number
20160131887
Publication date
May 12, 2016
BIOTEK INSTRUMENTS, INC.
Ben NORRIS
G02 - OPTICS
Information
Patent Application
UNIVERSAL MULTIDETECTION SYSTEM FOR MICROPLATES
Publication number
20120300194
Publication date
Nov 29, 2012
BTI HOLDINGS, INC.
Oleg ZIMENKOV
G01 - MEASURING TESTING