Benjamin L. Amey

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,624,769
- Issue date Apr 11, 2023
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,353,494
- Issue date Jun 7, 2022
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 10,613,134
- Issue date Apr 7, 2020
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
Overvoltage testing apparatus
- Patent number 8,674,352
- Issue date Mar 18, 2014
- Texas Instruments Incorporated
- Kannan Soundarapandian
- G01 - MEASURING TESTING
Information Patent Grant
Reference circuit with reduced current startup
- Patent number 8,022,686
- Issue date Sep 20, 2011
- Texas Instruments Incorporated
- Wei Lu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Circuits, devices and methods for regulator minimum load control
- Patent number 7,554,309
- Issue date Jun 30, 2009
- Texas Instruments Incorporated
- John H. Carpenter, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Thermal shutdown trip point modification during current limit
- Patent number 7,301,746
- Issue date Nov 27, 2007
- Texas Instruments Incorporated
- Vijayalakshmi Devarajan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
CAN receiver wake-up circuit
- Patent number 6,747,498
- Issue date Jun 8, 2004
- Texas Instruments Incorporated
- Timothy P. Pauletti
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20220260627
- Publication date Aug 18, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20200182925
- Publication date Jun 11, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20180180661
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
OVERVOLTAGE TESTING APPARATUS
- Publication number 20130221342
- Publication date Aug 29, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Kannan Soundarapandian
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE CIRCUIT WITH REDUCED CURRENT STARTUP
- Publication number 20100283448
- Publication date Nov 11, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Wei Lu
- G05 - CONTROLLING REGULATING
Information Patent Application
Thermal shutdown trip point modification during current limit
- Publication number 20070064369
- Publication date Mar 22, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Vijayalakshmi Devarajan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuits, devices and methods for regulator minimum load control
- Publication number 20060261793
- Publication date Nov 23, 2006
- TEXAS INSTRUMENTS INCORPORATED
- John H. Carpenter
- G05 - CONTROLLING REGULATING
Information Patent Application
CAN RECEIVER WAKE-UP CIRCUIT
- Publication number 20040119517
- Publication date Jun 24, 2004
- Timothy P. Pauletti
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Benjamin L. Amey

Person

Patents Grantslast 30 patents

High-side gate over-voltage stress testing

High-side gate over-voltage stress testing

High-side gate over-voltage stress testing

Overvoltage testing apparatus

Reference circuit with reduced current startup

Circuits, devices and methods for regulator minimum load control

Thermal shutdown trip point modification during current limit

CAN receiver wake-up circuit

Patents Applicationslast 30 patents

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

OVERVOLTAGE TESTING APPARATUS

REFERENCE CIRCUIT WITH REDUCED CURRENT STARTUP

Thermal shutdown trip point modification during current limit

Circuits, devices and methods for regulator minimum load control

CAN RECEIVER WAKE-UP CIRCUIT