Benjamin L. Hall

Follow

Person

Corning, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor array tester
- Patent number 7,256,879
- Issue date Aug 14, 2007
- Corning Incorporated
- Benjamin L. Hall
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an InP based vertical cavity surface emitti...
- Patent number 7,072,376
- Issue date Jul 4, 2006
- Corning Incorporated
- Catherine G Caneau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Machine for inspecting the bottom of glass containers
- Patent number 5,349,435
- Issue date Sep 20, 1994
- Emhart Glass Machinery Investments Inc.
- Benjamin L. Hall
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of manufacturing an InP based vertical cavity surface emitti...
- Publication number 20060056475
- Publication date Mar 16, 2006
- Catherine G. Caneau
- B82 - NANO-TECHNOLOGY
Information Patent Application
Semiconductor array tester
- Publication number 20050128469
- Publication date Jun 16, 2005
- Benjamin L. Hall
- G01 - MEASURING TESTING