Benjamin R. Cipriany

Follow

Person

Wappingers Falls, NY, US

People

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-BASED DEFECT ROOT CAUSE AND YIELD IMPACT DETERMINATION IN...
- Publication number 20150204799
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Benjamin R. Cipriany
- G01 - MEASURING TESTING