Benjamin S. Crowe

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Centerville, DE, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for high resolution analysis
- Patent number 5,368,391
- Issue date Nov 29, 1994
- TA Instruments, Inc.
- Benjamin S. Crowe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for modulated differential analysis
- Patent number 5,346,306
- Issue date Sep 13, 1994
- TA Instruments, Inc.
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for modulated differential analysis
- Patent number 5,224,775
- Issue date Jul 6, 1993
- TA Instruments, Inc.
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high resolution analysis
- Patent number 5,165,792
- Issue date Nov 24, 1992
- TA Instruments, Inc.
- Benjamin S. Crowe
- G01 - MEASURING TESTING