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Benjamin S. Fraenkel
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Jerusalem, IL
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last 30 patents
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Patent Grant
X-ray imaging crystal spectrometer for extended X-ray sources
Patent number
6,259,763
Issue date
Jul 10, 2001
The United States of America as represented by the United States Department o...
Manfred L. Bitter
G01 - MEASURING TESTING
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Patent Grant
Production of monochromatic x-ray images of x-ray sources and space...
Patent number
4,426,719
Issue date
Jan 17, 1984
Yissum Research Development Co. of the Hebrew University of Jerusalem
Benjamin S. Fraenkel
G01 - MEASURING TESTING