Benjamin Shieh

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Reusable test chip for inline probing of three dimensionally arrang...
- Patent number 8,362,480
- Issue date Jan 29, 2013
- PDF Solutions, Inc.
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting and monitoring nickel-silicide pr...
- Patent number 7,932,105
- Issue date Apr 26, 2011
- PDF Solutions
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS