Benno Orschel

Person

Salem, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,673,075
- Issue date Mar 18, 2014
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for controlling diameter of a silicon crystal...
- Patent number 8,641,822
- Issue date Feb 4, 2014
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for controlling the growth process of a monocr...
- Patent number 8,545,623
- Issue date Oct 1, 2013
- Sumco Phoenix Corporation
- Benno Orschel
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting speed deviations between actual and nominal p...
- Patent number 8,496,765
- Issue date Jul 30, 2013
- Sumco Phoenix Corporation
- Benno Orschel
- G05 - CONTROLLING REGULATING
Information Patent Grant
Procedure for in-situ determination of thermal gradients at the cry...
- Patent number 8,221,545
- Issue date Jul 17, 2012
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for controlling diameter of a silicon crystal...
- Patent number 8,012,255
- Issue date Sep 6, 2011
- Sumco Phoenix Corporation
- Benno Orschel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and device for determining the dependence of a first measuri...
- Patent number 6,526,372
- Issue date Feb 25, 2003
- Aoti Operating Company, Inc.
- Benno Orschel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...
- Publication number 20120186512
- Publication date Jul 26, 2012
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CORRECTING SPEED DEVIATIONS BETWEEN ACTUAL AND NOMINAL P...
- Publication number 20110060467
- Publication date Mar 10, 2011
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and apparatus for controlling the growth process of a monocr...
- Publication number 20100319611
- Publication date Dec 23, 2010
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...
- Publication number 20100206219
- Publication date Aug 19, 2010
- SUMCO PHOENIX CORPORATION
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...
- Publication number 20100024716
- Publication date Feb 4, 2010
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
Procedure for in-situ determination of thermal gradients at the cry...
- Publication number 20100024718
- Publication date Feb 4, 2010
- Benno Orschel
- C30 - CRYSTAL GROWTH
Information Patent Application
Reversed action diameter control in a semiconductor crystal growth...
- Publication number 20100024717
- Publication date Feb 4, 2010
- Benno Orschel
- C30 - CRYSTAL GROWTH

Benno Orschel

Person

Patents Grantslast 30 patents

Procedure for in-situ determination of thermal gradients at the cry...

Method and apparatus for controlling diameter of a silicon crystal...

Method and apparatus for controlling the growth process of a monocr...

Method for correcting speed deviations between actual and nominal p...

Procedure for in-situ determination of thermal gradients at the cry...

Method and apparatus for controlling diameter of a silicon crystal...

Method and device for determining the dependence of a first measuri...

Patents Applicationslast 30 patents

PROCEDURE FOR IN-SITU DETERMINATION OF THERMAL GRADIENTS AT THE CRY...

METHOD FOR CORRECTING SPEED DEVIATIONS BETWEEN ACTUAL AND NOMINAL P...

Method and apparatus for controlling the growth process of a monocr...

METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...

METHOD AND APPARATUS FOR CONTROLLING DIAMETER OF A SILICON CRYSTAL...

Procedure for in-situ determination of thermal gradients at the cry...

Reversed action diameter control in a semiconductor crystal growth...