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Benno Orschel
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St. Louis, MO, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and systems for preventing unsafe operations
Patent number
10,361,106
Issue date
Jul 23, 2019
GlobalWafers Co., Ltd.
Benno Orschel
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
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Patent Application
FULL WAFER THICKNESS MAP REFLECTOMETRY
Publication number
20240401930
Publication date
Dec 5, 2024
GLOBALWAFERS CO., LTD.
Benno Orschel
G01 - MEASURING TESTING
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Patent Application
METHODS AND SYSTEMS FOR PREVENTING UNSAFE OPERATIONS
Publication number
20180315631
Publication date
Nov 1, 2018
GLOBALWAFERS CO., LTD.
Benno Orschel
G05 - CONTROLLING REGULATING