Benny W. H. Lai

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Assay reader operable to scan a test strip
- Patent number 11,204,328
- Issue date Dec 21, 2021
- Alverix, Inc.
- Tong Xie
- G01 - MEASURING TESTING
Information Patent Grant
Assay reader operable to scan a test strip
- Patent number 10,295,472
- Issue date May 21, 2019
- Alverix, Inc.
- Tong Xie
- G01 - MEASURING TESTING
Information Patent Grant
Embedded testing capability for integrated serializer/deserializers
- Patent number 7,343,535
- Issue date Mar 11, 2008
- Avago Technologies General IP Dte Ltd
- Benny W. H. Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus of boundary scan testing for AC-coupled differ...
- Patent number 6,763,486
- Issue date Jul 13, 2004
- Agilent Technologies, Inc.
- Benny W H Lai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ASSAY READER OPERABLE TO SCAN A TEST STRIP
- Publication number 20220187214
- Publication date Jun 16, 2022
- Alverix, Inc.
- Tong Xie
- G01 - MEASURING TESTING
Information Patent Application
ASSAY READER OPERABLE TO SCAN A TEST STRIP
- Publication number 20190271653
- Publication date Sep 5, 2019
- Alverix, Inc.
- Tong Xie
- G01 - MEASURING TESTING
Information Patent Application
MODULAR ASSAY READER DEVICE
- Publication number 20190187139
- Publication date Jun 20, 2019
- Becton, Dickinson and Company
- Tong Xie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Embedded testing capability for integrated serializer/deserializers
- Publication number 20030149922
- Publication date Aug 7, 2003
- Benny W.H. Lai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus of boundary scan testing for AC-coupled differ...
- Publication number 20020170011
- Publication date Nov 14, 2002
- Benny W. H. Lai
- G01 - MEASURING TESTING