Benoit Quirion

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Boucherville, CA

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Patents Grantslast 30 patents

Information Patent Grant
System and method for height profile measurement of reflecting objects
- Patent number 7,522,289
- Issue date Apr 21, 2009
- Solvision, Inc.
- Michel Cantin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for simultaneous 3D height measurements on multip...
- Patent number 7,433,058
- Issue date Oct 7, 2008
- SolVision Inc.
- Michel Cantin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR OBJECT INSPECTION USING RELIEF DETERMINATION
- Publication number 20080117438
- Publication date May 22, 2008
- SOLVISION INC.
- Benoit Quirion
- G01 - MEASURING TESTING
Information Patent Application
FAST 3D HEIGHT MEASUREMENT METHOD AND SYSTEM
- Publication number 20080068617
- Publication date Mar 20, 2008
- SOLVISION INC.
- Michel Cantin
- G01 - MEASURING TESTING
Information Patent Application
3D and 2D measurement system and method with increased sensitivity...
- Publication number 20060109482
- Publication date May 25, 2006
- Yan Duval
- G01 - MEASURING TESTING
Information Patent Application
System and method for height profile measurement of reflecting objects
- Publication number 20060077398
- Publication date Apr 13, 2006
- Michel Cantin
- G01 - MEASURING TESTING
Information Patent Application
System and method for simultaneous 3D height measurements on multip...
- Publication number 20060007450
- Publication date Jan 12, 2006
- Michel Cantin
- G01 - MEASURING TESTING
Information Patent Application
Fast 3D height measurement method and system
- Publication number 20040130730
- Publication date Jul 8, 2004
- Michel Cantin
- G01 - MEASURING TESTING