Benoit Wattellier

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Paris, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for analysing an electromagnetic wave in high def...
- Patent number 11,029,214
- Issue date Jun 8, 2021
- PHASICS
- Benoît Wattellier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN ELECTROMAGNETIC WAVE IN HIGH DEF...
- Publication number 20190285481
- Publication date Sep 19, 2019
- PHASICS
- Benoît WATTELLIER
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR STRUCTURAL ANALYSIS OF AN OBJECT BY MEASURING...
- Publication number 20120274945
- Publication date Nov 1, 2012
- Universite Paul Cezanne Aix-Marseille III
- Pierre Bon
- G01 - MEASURING TESTING