BENYONG CHEN

Person

HANGZHOU, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Variable synthetic wavelength absolute distance measuring device lo...
- Patent number 12,007,250
- Issue date Jun 11, 2024
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Differential sinusoidal phase modulation laser interferometric nano...
- Patent number 11,255,655
- Issue date Feb 22, 2022
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Sinusoidal frequency sweeping interferometric absolute distance mea...
- Patent number 11,231,268
- Issue date Jan 25, 2022
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Phase delay extraction and compensation method in PGC phase demodul...
- Patent number 11,168,975
- Issue date Nov 9, 2021
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Real-time normalization apparatus and method of phase generated car...
- Patent number 10,641,600
- Issue date May 5, 2020
- Zhejiang Sci-Tech University
- Liping Yan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dual-homodyne laser interferometric nanometer displacement measurin...
- Patent number 10,151,573
- Issue date Dec 11, 2018
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Method of air refractive index correction for absolute long distanc...
- Patent number 10,024,647
- Issue date Jul 17, 2018
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Laser heterodyne interferometric straightness measurement apparatus...
- Patent number 9,863,753
- Issue date Jan 9, 2018
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Absolute distance measurement apparatus and method using laser inte...
- Patent number 9,835,441
- Issue date Dec 5, 2017
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Laser heterodyne interferometric signal processing method based on...
- Patent number 9,797,705
- Issue date Oct 24, 2017
- Zhejiang Sci-Tech University
- Benyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the refractive index of air base...
- Patent number 8,665,452
- Issue date Mar 4, 2014
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING-BASED DIGITAL HOLOGRAPHIC CONTINUOUS PHASE NOISE REDU...
- Publication number 20240361727
- Publication date Oct 31, 2024
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL HOLOGRAPHIC WRAPPED PHASE ABERRATION COMPENSATION METHOD BA...
- Publication number 20240273691
- Publication date Aug 15, 2024
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE SYNTHETIC WAVELENGTH ABSOLUTE DISTANCE MEASURING DEVICE LO...
- Publication number 20220260368
- Publication date Aug 18, 2022
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...
- Publication number 20210199418
- Publication date Jul 1, 2021
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
SINUSOIDAL FREQUENCY SWEEPING INTERFEROMETRIC ABSOLUTE DISTANCE MEA...
- Publication number 20210025689
- Publication date Jan 28, 2021
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
PHASE DELAY EXTRACTION AND COMPENSATION METHOD IN PGC PHASE DEMODUL...
- Publication number 20200263973
- Publication date Aug 20, 2020
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME NORMALIZATION APPARATUS AND METHOD OF PHASE GENERATED CAR...
- Publication number 20190368860
- Publication date Dec 5, 2019
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...
- Publication number 20180328710
- Publication date Nov 15, 2018
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AIR REFRACTIVE INDEX CORRECTION FOR ABSOLUTE LONG DISTANC...
- Publication number 20180045500
- Publication date Feb 15, 2018
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
ABSOLUTE DISTANCE MEASUREMENT APPARATUS AND METHOD USING LASER INTE...
- Publication number 20170038192
- Publication date Feb 9, 2017
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
LASER HETERODYNE INTERFEROMETRIC STRAIGHTNESS MEASUREMENT APPARATUS...
- Publication number 20160370170
- Publication date Dec 22, 2016
- ZHEJIANG SCI-TECH UNIVERSITY
- Benyong CHEN
- G01 - MEASURING TESTING
Information Patent Application
LASER HETERODYNE INTERFEROMETRIC SIGNAL PROCESSING METHOD BASED ON...
- Publication number 20150046111
- Publication date Feb 12, 2015
- Zhejiang Sci-Tech University
- BENYONG CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING THE REFRACTIVE INDEX OF AIR BASE...
- Publication number 20130258348
- Publication date Oct 3, 2013
- Liping Yan
- G01 - MEASURING TESTING

BENYONG CHEN

Person

Patents Grantslast 30 patents

Variable synthetic wavelength absolute distance measuring device lo...

Differential sinusoidal phase modulation laser interferometric nano...

Sinusoidal frequency sweeping interferometric absolute distance mea...

Phase delay extraction and compensation method in PGC phase demodul...

Real-time normalization apparatus and method of phase generated car...

Dual-homodyne laser interferometric nanometer displacement measurin...

Method of air refractive index correction for absolute long distanc...

Laser heterodyne interferometric straightness measurement apparatus...

Absolute distance measurement apparatus and method using laser inte...

Laser heterodyne interferometric signal processing method based on...

Method and apparatus for measuring the refractive index of air base...

Patents Applicationslast 30 patents

DEEP LEARNING-BASED DIGITAL HOLOGRAPHIC CONTINUOUS PHASE NOISE REDU...

DIGITAL HOLOGRAPHIC WRAPPED PHASE ABERRATION COMPENSATION METHOD BA...

VARIABLE SYNTHETIC WAVELENGTH ABSOLUTE DISTANCE MEASURING DEVICE LO...

DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...

SINUSOIDAL FREQUENCY SWEEPING INTERFEROMETRIC ABSOLUTE DISTANCE MEA...

PHASE DELAY EXTRACTION AND COMPENSATION METHOD IN PGC PHASE DEMODUL...

REAL-TIME NORMALIZATION APPARATUS AND METHOD OF PHASE GENERATED CAR...

DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...

METHOD OF AIR REFRACTIVE INDEX CORRECTION FOR ABSOLUTE LONG DISTANC...

ABSOLUTE DISTANCE MEASUREMENT APPARATUS AND METHOD USING LASER INTE...

LASER HETERODYNE INTERFEROMETRIC STRAIGHTNESS MEASUREMENT APPARATUS...

LASER HETERODYNE INTERFEROMETRIC SIGNAL PROCESSING METHOD BASED ON...

METHOD AND APPARATUS FOR MEASURING THE REFRACTIVE INDEX OF AIR BASE...