Benyong Zhang

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Federal Way, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Clock conditioner circuitry with improved holdover exit transient p...
- Patent number 9,680,484
- Issue date Jun 13, 2017
- Texas Instruments Incorporated
- Benyong Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing integrated circuit packaging for output short circuit current
- Patent number 9,140,751
- Issue date Sep 22, 2015
- Texas Instruments Incorporated
- Chee Peng Ong
- G01 - MEASURING TESTING
Information Patent Grant
Fractional-N PLL using multiple phase comparison frequencies to imp...
- Patent number 8,502,575
- Issue date Aug 6, 2013
- Texas Instruments Incorporated
- Benyong Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Programmable dual phase-locked loop clock signal generator and cond...
- Patent number 8,102,196
- Issue date Jan 24, 2012
- National Semiconductor Corporation
- Benyong Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for providing a phase-locked loop with reduced sp...
- Patent number 7,038,509
- Issue date May 2, 2006
- National Semiconductor Corporation
- Benyong Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CLOCK CONDITIONER CIRCUITRY WITH IMPROVED HOLDOVER EXIT TRANSIENT P...
- Publication number 20160164532
- Publication date Jun 9, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Benyong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Testing Integrated Circuit Packaging for Output Short Circuit Current
- Publication number 20140292361
- Publication date Oct 2, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Chee Peng Ong
- G01 - MEASURING TESTING
Information Patent Application
Fractional-N PLL Using Multiple Phase Comparison Frequencies to Imp...
- Publication number 20120074995
- Publication date Mar 29, 2012
- National Semiconductor Corporation
- Benyong ZHANG
- H03 - BASIC ELECTRONIC CIRCUITRY