Benzion Sender

Person

Modiin-Macabim-Reut, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for evaluating objects
- Patent number 11,177,048
- Issue date Nov 16, 2021
- Applied Materials Israel Ltd.
- Igor Krivts (Krayvitz)
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray based metrology of a high aspect ratio hole
- Patent number 11,047,677
- Issue date Jun 29, 2021
- Applied Materials Israel Ltd.
- Benzion Sender
- G01 - MEASURING TESTING
Information Patent Grant
Scanning an object using multiple mechanical stages
- Patent number 10,068,748
- Issue date Sep 4, 2018
- Applied Materials Israel Ltd.
- Yoram Uziel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,847,209
- Issue date Dec 19, 2017
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,805,911
- Issue date Oct 31, 2017
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for charging and imaging an object
- Patent number 9,666,412
- Issue date May 30, 2017
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning an object
- Patent number 9,490,101
- Issue date Nov 8, 2016
- Applied Materials Israel Ltd.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,466,462
- Issue date Oct 11, 2016
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable rate scanning in an electron microscope
- Patent number 8,207,499
- Issue date Jun 26, 2012
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for focusing a charged particle beam
- Patent number 7,535,001
- Issue date May 19, 2009
- Applied Materials, Israel, Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vector-matrix multiplication
- Patent number 7,536,431
- Issue date May 19, 2009
- Lenslet Labs Ltd.
- Avner Goren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for focusing a charged particle beam
- Patent number 7,375,326
- Issue date May 20, 2008
- Applied Materials, Israel, Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of scanning an object that includes multiple regions of int...
- Patent number 7,285,779
- Issue date Oct 23, 2007
- Applied Materials Israel, Ltd.
- Alon Litman
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting charged particle responsive resist
- Patent number 7,235,794
- Issue date Jun 26, 2007
- Applied Materials, Inc.
- Benzion Sender
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY BASED METROLOGY OF A HIGH ASPECT RATIO HOLE
- Publication number 20210156682
- Publication date May 27, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Benzion Sender
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING OBJECTS
- Publication number 20210151214
- Publication date May 20, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Igor Krivts (Krayvitz)
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES
- Publication number 20170084425
- Publication date Mar 23, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM
- Publication number 20160322195
- Publication date Nov 3, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20160276127
- Publication date Sep 22, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM
- Publication number 20150200071
- Publication date Jul 16, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE
- Publication number 20100072365
- Publication date Mar 25, 2010
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FOCUSING A CHARGED PARTICLE BEAM
- Publication number 20080011964
- Publication date Jan 17, 2008
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for focusing a charged particle beam
- Publication number 20060049364
- Publication date Mar 9, 2006
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of scanning an object that includes multiple regions of int...
- Publication number 20050279936
- Publication date Dec 22, 2005
- Applied Materials Israel Ltd.
- Alon Litman
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting charged particle responsive resist
- Publication number 20050067582
- Publication date Mar 31, 2005
- Benzion Sender
- G01 - MEASURING TESTING
Information Patent Application
Vector-matrix multiplication
- Publication number 20040243657
- Publication date Dec 2, 2004
- Avner Goren
- G06 - COMPUTING CALCULATING COUNTING

Benzion Sender

Person

Patents Grantslast 30 patents

Method and system for evaluating objects

X-ray based metrology of a high aspect ratio hole

Scanning an object using multiple mechanical stages

Inspection of regions of interest using an electron beam system

Inspection of regions of interest using an electron beam system

Method for charging and imaging an object

System and method for scanning an object

Inspection of regions of interest using an electron beam system

Variable rate scanning in an electron microscope

Method and system for focusing a charged particle beam

Vector-matrix multiplication

Method and system for focusing a charged particle beam

Methods of scanning an object that includes multiple regions of int...

System and method for inspecting charged particle responsive resist

Patents Applicationslast 30 patents

X-RAY BASED METROLOGY OF A HIGH ASPECT RATIO HOLE

METHOD AND SYSTEM FOR EVALUATING OBJECTS

SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES

INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM

SYSTEM AND METHOD FOR SCANNING AN OBJECT

INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM

VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE

METHOD AND SYSTEM FOR FOCUSING A CHARGED PARTICLE BEAM

Method and system for focusing a charged particle beam

Methods of scanning an object that includes multiple regions of int...

System and method for inspecting charged particle responsive resist

Vector-matrix multiplication