Berend Helmerus Lich

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Weert, NL

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 9,711,325
- Issue date Jul 18, 2017
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computational scanning microscopy with improved resolution
- Patent number 9,478,393
- Issue date Oct 25, 2016
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Charged particle microscope providing depth-resolved imagery
- Patent number 8,704,176
- Issue date Apr 22, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 8,586,921
- Issue date Nov 19, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle microscopy imaging method
- Patent number 8,581,189
- Issue date Nov 12, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
SEM imaging method
- Patent number 8,232,523
- Issue date Jul 31, 2012
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION
- Publication number 20160013015
- Publication date Jan 14, 2016
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY
- Publication number 20140312226
- Publication date Oct 23, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Microscope Providing Depth-Resolved Imagery
- Publication number 20130228683
- Publication date Sep 5, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY
- Publication number 20130037715
- Publication date Feb 14, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Microscopy Imaging Method
- Publication number 20130037714
- Publication date Feb 14, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
SEM Imaging Method
- Publication number 20110266440
- Publication date Nov 3, 2011
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS