Bernard Drevillon

Person

Meudon, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
- Patent number 9,366,694
- Issue date Jun 14, 2016
- Ecole Polytechnique
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for taking spectroscopic polarimetric measurement...
- Patent number 8,405,830
- Issue date Mar 26, 2013
- HORIBA Jobin Yvon SAS
- Denis Cattelan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic polarimetric imaging system for a colposcopy device and...
- Patent number 8,214,024
- Issue date Jul 3, 2012
- Ecole Polytechnique
- Antonello De Martino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Transistor for active matrix display and a method for producing sai...
- Patent number 7,863,113
- Issue date Jan 4, 2011
- Centre National de la Recherche Scientifique
- Pere Roca I Cabarrocas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarimetric Raman system and method for analysing a sample
- Patent number 7,859,661
- Issue date Dec 28, 2010
- Ecole Polytechnique
- Razvigor Ossikovski
- G01 - MEASURING TESTING
Information Patent Grant
Metrological characterisation of microelectronic circuits
- Patent number 7,777,880
- Issue date Aug 17, 2010
- Ecole Polytechnique
- Antonello De Martino
- G01 - MEASURING TESTING
Information Patent Grant
Photoactive nanocomposite and method for the production thereof
- Patent number 7,713,779
- Issue date May 11, 2010
- Commissariat a l'Energie Atomique
- Muriel Firon
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Broadband ellipsometer / polarimeter system
- Patent number 7,298,480
- Issue date Nov 20, 2007
- Ecole Polytechnique
- Enric Garcia-Caurel
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal based polarimetric system, a process for the calibra...
- Patent number 7,196,792
- Issue date Mar 27, 2007
- Centre National de la Recherche Scientifique (CNRS)
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing or controlling the production of a thin-l...
- Patent number 7,046,379
- Issue date May 16, 2006
- Centre National de la Recherche Scientifique (Cnrs)
- Alfred Hofrichter
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric method and control device for making a thin-layered c...
- Patent number 6,914,675
- Issue date Jul 5, 2005
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Method for real-time control of the fabrication of a thin-film stru...
- Patent number 6,868,312
- Issue date Mar 15, 2005
- L'Air Liquide Societe Anonyme A Directoire et Conseil de Surveillance pour l'...
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optically characterising thin layered material
- Patent number 6,657,708
- Issue date Dec 2, 2003
- Jobin Yvon Sa
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Method for treating polymer surface
- Patent number 6,613,434
- Issue date Sep 2, 2003
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and installation for treating a metal part surface
- Patent number 6,561,198
- Issue date May 13, 2003
- L'Air Liquide Societe Anonyme A Directoire et Conseil de Surveillance pour l'...
- Bernard Drevillon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Polarimeter and corresponding measuring method
- Patent number 6,177,995
- Issue date Jan 23, 2001
- Centre National de la Recherche Scientifique
- Eric Compain
- G01 - MEASURING TESTING
Information Patent Grant
Optical component for polarization modulation, a mueller polarimete...
- Patent number 6,175,412
- Issue date Jan 16, 2001
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- G02 - OPTICS
Information Patent Grant
Multi-detector ellipsometer and process of multi-detector ellipsome...
- Patent number 5,757,671
- Issue date May 26, 1998
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Method of ellipsometric measurement, an ellipsometer and device for...
- Patent number 5,666,200
- Issue date Sep 9, 1997
- Instruments S.A.
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer modulated by an external excitation
- Patent number 5,536,936
- Issue date Jul 16, 1996
- Centre National de la Recherche
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Dual-modulation interferometric ellipsometer
- Patent number 5,485,271
- Issue date Jan 16, 1996
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Micro...
- Publication number 20160003866
- Publication date Jan 7, 2016
- ECOLE POLYTECHNIQUE
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TAKING SPECTROSCOPIC POLARIMETRIC MEASUREMENT...
- Publication number 20110205539
- Publication date Aug 25, 2011
- HORIBA JOBIN YVON SAS
- Denis Cattelan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR GENERATING A PLASMA
- Publication number 20100074807
- Publication date Mar 25, 2010
- ECOLE POLYTECHNIQUE
- Pavel Bulkin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Polarimetric Raman System and Method For Analysing a Sample
- Publication number 20080304061
- Publication date Dec 11, 2008
- ECOLE POLYTECHNIQUE
- Razvigor Ossikovski
- G01 - MEASURING TESTING
Information Patent Application
Electronic Polarimetric Imaging System for a Colposcopy Device and...
- Publication number 20080200817
- Publication date Aug 21, 2008
- ECOLE POLYTECHNIQUE
- Antonello De Martino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Photoactive Nanocomposite and Method for the Production Thereof
- Publication number 20070290197
- Publication date Dec 20, 2007
- Muriel Firon
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Metrological Characterisation of Microelectronic Circuits
- Publication number 20070263219
- Publication date Nov 15, 2007
- Centre National de la Recherche Scientifique
- Antonello De Martino
- G01 - MEASURING TESTING
Information Patent Application
Broadband ellipsometer / polarimeter system
- Publication number 20070146706
- Publication date Jun 28, 2007
- Ecole Polytechnique
- Enric Garcia-Caurel
- G01 - MEASURING TESTING
Information Patent Application
Electronic control cell for an active matrix display organic electr...
- Publication number 20070091030
- Publication date Apr 26, 2007
- Centre National de la Recherche Scientifique
- Bernard Drevillon
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Transistor for active matrix display and a method for producing sai...
- Publication number 20060240602
- Publication date Oct 26, 2006
- Pere Roca I Cabarrocas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for polarimetric measurement of the mueller matri...
- Publication number 20050105088
- Publication date May 19, 2005
- Enrique Garcia-Caurel
- G01 - MEASURING TESTING
Information Patent Application
FTIR ellipsometry device and process for characterization and furth...
- Publication number 20050012041
- Publication date Jan 20, 2005
- Enric Garcia-Caurel
- G01 - MEASURING TESTING
Information Patent Application
Liquid crystal based polarimetric system, a process for the calibra...
- Publication number 20040130717
- Publication date Jul 8, 2004
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Application
Method for characterising or controlling the production of a thin-l...
- Publication number 20040114131
- Publication date Jun 17, 2004
- Alfred Hofrichter
- G01 - MEASURING TESTING
Information Patent Application
Method for real-time control of the fabrication of a thin-film stru...
- Publication number 20020126283
- Publication date Sep 12, 2002
- Bernard Drevillon
- G01 - MEASURING TESTING

Bernard Drevillon

Person

Patents Grantslast 30 patents

Microscope having a multimode local probe, tip-enhanced raman micro...

Device and method for taking spectroscopic polarimetric measurement...

Electronic polarimetric imaging system for a colposcopy device and...

Transistor for active matrix display and a method for producing sai...

Polarimetric Raman system and method for analysing a sample

Metrological characterisation of microelectronic circuits

Photoactive nanocomposite and method for the production thereof

Broadband ellipsometer / polarimeter system

Liquid crystal based polarimetric system, a process for the calibra...

Method for characterizing or controlling the production of a thin-l...

Ellipsometric method and control device for making a thin-layered c...

Method for real-time control of the fabrication of a thin-film stru...

Apparatus for optically characterising thin layered material

Method for treating polymer surface

Method and installation for treating a metal part surface

Polarimeter and corresponding measuring method

Optical component for polarization modulation, a mueller polarimete...

Multi-detector ellipsometer and process of multi-detector ellipsome...

Method of ellipsometric measurement, an ellipsometer and device for...

Spectroscopic ellipsometer modulated by an external excitation

Dual-modulation interferometric ellipsometer

Patents Applicationslast 30 patents

Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Micro...

DEVICE AND METHOD FOR TAKING SPECTROSCOPIC POLARIMETRIC MEASUREMENT...

APPARATUS FOR GENERATING A PLASMA

Polarimetric Raman System and Method For Analysing a Sample

Electronic Polarimetric Imaging System for a Colposcopy Device and...

Photoactive Nanocomposite and Method for the Production Thereof

Metrological Characterisation of Microelectronic Circuits

Broadband ellipsometer / polarimeter system

Electronic control cell for an active matrix display organic electr...

Transistor for active matrix display and a method for producing sai...

Method and device for polarimetric measurement of the mueller matri...

FTIR ellipsometry device and process for characterization and furth...

Liquid crystal based polarimetric system, a process for the calibra...

Method for characterising or controlling the production of a thin-l...

Method for real-time control of the fabrication of a thin-film stru...