Bernard Fay

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Sarasota, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated overlay metrology system
- Patent number 7,368,206
- Issue date May 6, 2008
- Nikon Corporation
- Bernard Fay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for controlling fluid flow in an optical assembly
- Patent number 6,847,431
- Issue date Jan 25, 2005
- Nikon Corporation
- Derek Coon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Automated overlay metrology system
- Publication number 20060115751
- Publication date Jun 1, 2006
- Bernard Fay
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and device for controlling fluid flow in an optical assembly
- Publication number 20040179174
- Publication date Sep 16, 2004
- Derek Coon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY