Bernard Siu

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Diamond Bar, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for evaluating integrity of adherence of a conduc...
- Patent number 5,535,006
- Issue date Jul 9, 1996
- Lockheed Idaho Technologies Company
- Kenneth L. Telschow
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronics inspection system
- Patent number 5,424,838
- Issue date Jun 13, 1995
- Bernard Siu
- G01 - MEASURING TESTING
Information Patent Grant
High speed illumination system for microelectronics inspection
- Patent number 5,420,689
- Issue date May 30, 1995
- Bernard Siu
- G01 - MEASURING TESTING
Information Patent Grant
High speed image acquisition for microelectronics inspection
- Patent number 5,302,836
- Issue date Apr 12, 1994
- Bernard Siu
- G01 - MEASURING TESTING