Bernardo Kastrup

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Computational wafer inspection
- Patent number 12,067,340
- Issue date Aug 20, 2024
- ASML Netherlands B.V.
- Christophe David Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,875,966
- Issue date Jan 16, 2024
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,094,502
- Issue date Aug 17, 2021
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computational wafer inspection
- Patent number 11,080,459
- Issue date Aug 3, 2021
- ASML Netherlands B.V.
- Christophe David Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to correct for patterning process error
- Patent number 10,915,689
- Issue date Feb 9, 2021
- ASML Netherlands B.V.
- Peter Ten Berge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computational wafer inspection
- Patent number 10,579,772
- Issue date Mar 3, 2020
- ASML Netherlands B.V.
- Christophe David Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computational wafer inspection
- Patent number 9,990,462
- Issue date Jun 5, 2018
- ASML Netherlands B.V.
- Christophe David Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational wafer inspection
- Patent number 9,507,907
- Issue date Nov 29, 2016
- ASML Netherlands B.V.
- Christophe David Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and methods for determining an improved conf...
- Patent number 9,229,336
- Issue date Jan 5, 2016
- ASML Netherlands B.V.
- Jozef Maria Finders
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic system, device manufacturing method, setpoint data opt...
- Patent number 8,259,285
- Issue date Sep 4, 2012
- ASML Holding N.V.
- Kars Zeger Troost
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20240403537
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20240186107
- Publication date Jun 6, 2024
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20210375581
- Publication date Dec 2, 2021
- ASML NETHERLANDS B.V.
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20210357570
- Publication date Nov 18, 2021
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
- Publication number 20210079519
- Publication date Mar 18, 2021
- ASML NETHERLANDS B.V.
- Pieter Willem Herman DE JAGER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20200218849
- Publication date Jul 9, 2020
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION
- Publication number 20190006147
- Publication date Jan 3, 2019
- ASML NETHERLANDS B.V.
- Bernardo KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20180365369
- Publication date Dec 20, 2018
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR
- Publication number 20180307135
- Publication date Oct 25, 2018
- ASML NETHERLANDS B.V.
- Peter TEN BERGE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR
- Publication number 20180299770
- Publication date Oct 18, 2018
- ASML NETHERLANDS B.V.
- Peter TEN BERGE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20170046473
- Publication date Feb 16, 2017
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20150356233
- Publication date Dec 10, 2015
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHIC APPARATUS AND METHODS FOR DETERMINING AN IMPROVED CONF...
- Publication number 20120194797
- Publication date Aug 2, 2012
- ASML NETHERLANDS B.V.
- Jozef Maria FINDERS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM FOR GENERATING AND DISPLAYING IMAGES
- Publication number 20100302129
- Publication date Dec 2, 2010
- Bernardo KASTRUP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR GENERATING AND DISPLAYING VISUAL CONTENT
- Publication number 20100097294
- Publication date Apr 22, 2010
- Bernardo KASTRUP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING VISUAL PATTERNS
- Publication number 20100097381
- Publication date Apr 22, 2010
- Bernardo KASTRUP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithographic system, device manufacturing method, setpoint data opt...
- Publication number 20080143982
- Publication date Jun 19, 2008
- ASML Holding N.V.
- Kars Zeger Troost
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Bernardo Kastrup

Person

Patents Grantslast 30 patents

Computational wafer inspection

Method and apparatus for inspection

Method and apparatus for inspection

Computational wafer inspection

Method and apparatus to correct for patterning process error

Computational wafer inspection

Computational wafer inspection

Computational wafer inspection

Lithographic apparatus and methods for determining an improved conf...

Lithographic system, device manufacturing method, setpoint data opt...

Patents Applicationslast 30 patents

COMPUTATIONAL WAFER INSPECTION

METHOD AND APPARATUS FOR INSPECTION

METHOD AND APPARATUS FOR INSPECTION

COMPUTATIONAL WAFER INSPECTION

METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL

COMPUTATIONAL WAFER INSPECTION

METHOD AND APPARATUS FOR INSPECTION

COMPUTATIONAL WAFER INSPECTION

METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR

METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR

COMPUTATIONAL WAFER INSPECTION

COMPUTATIONAL WAFER INSPECTION

LITHOGRAPHIC APPARATUS AND METHODS FOR DETERMINING AN IMPROVED CONF...

SYSTEM FOR GENERATING AND DISPLAYING IMAGES

APPARATUS AND METHOD FOR GENERATING AND DISPLAYING VISUAL CONTENT

METHOD AND APPARATUS FOR GENERATING VISUAL PATTERNS

Lithographic system, device manufacturing method, setpoint data opt...