Bernd Armbruster

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Karlsruhe, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining the path of a measurement beam of an interfe...
- Patent number 12,066,321
- Issue date Aug 20, 2024
- Polytec GmbH
- Bernd Armbruster
- G01 - MEASURING TESTING
Information Patent Grant
Alignment method for a beam-directing unit of an interferometric me...
- Patent number 11,333,485
- Issue date May 17, 2022
- Polytec GmbH
- Bernd Armbruster
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscope for optically measuring an object
- Patent number 7,518,101
- Issue date Apr 14, 2009
- Polytec GmbH
- Christian Rembe
- G02 - OPTICS
Information Patent Grant
Measurement device for non-contact detection of oscillations of an...
- Patent number 7,079,258
- Issue date Jul 18, 2006
- Polytec GmbH
- Helmut Selbach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING THE PATH OF A MEASUREMENT BEAM OF AN INTERFE...
- Publication number 20210278271
- Publication date Sep 9, 2021
- Polytec GmbH
- Bernd ARMBRUSTER
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT METHOD FOR A BEAM-DIRECTING UNIT OF AN INTERFEROMETRIC ME...
- Publication number 20210278197
- Publication date Sep 9, 2021
- Polytec GmbH
- Bernd ARMBRUSTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE PATH OF A MEASUREMENT BEAM OF AN INTERFE...
- Publication number 20210255030
- Publication date Aug 19, 2021
- Polytec GmbH
- Bernd ARMBRUSTER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICROSCOPE FOR OPTICALLY MEASURING AN OBJECT
- Publication number 20070291280
- Publication date Dec 20, 2007
- Polytec GmbH
- Christian Rembe
- G02 - OPTICS
Information Patent Application
Measurement device for non-contact detection of oscillations of an...
- Publication number 20040125378
- Publication date Jul 1, 2004
- Polytec GmbH
- Helmut Selbach
- G01 - MEASURING TESTING