Bernd Geck

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Hannover, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining scattering parameters using measurement arran...
- Patent number 9,470,713
- Issue date Oct 18, 2016
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system for determining scatter parameters
- Patent number 9,116,189
- Issue date Aug 25, 2015
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Contactless loop probe
- Patent number 8,963,570
- Issue date Feb 24, 2015
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement having a calibration substrate and electron...
- Patent number 8,791,705
- Issue date Jul 29, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for a vector network analysis system
- Patent number 8,760,184
- Issue date Jun 24, 2014
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Method for adjusting a fusing device of a digital printing machine...
- Patent number 7,583,907
- Issue date Sep 1, 2009
- Eastman Kodak Company
- Knut Behnke
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING SCATTERING PARAMETERS USING MEASUREMENT ARRAN...
- Publication number 20140300380
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS LOOP PROBE
- Publication number 20110267088
- Publication date Nov 3, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRON...
- Publication number 20110254536
- Publication date Oct 20, 2011
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM FOR DETERMINING SCATTER PARAMETERS
- Publication number 20110241712
- Publication date Oct 6, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20110163773
- Publication date Jul 7, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
Method For Adjusting A Fusing Device Of A Digital Printing Machine...
- Publication number 20070292151
- Publication date Dec 20, 2007
- Eastman Kodak Company
- Knut Behnke
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY