Bernd Laquai

Person

Stuttgart, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Test equipment, method for operating a test equipment and computer...
- Patent number 10,768,221
- Issue date Sep 8, 2020
- Advantest Corporation
- Bernd Laquai
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing a device under test and method...
- Patent number 10,234,498
- Issue date Mar 19, 2019
- Advantest Corporation
- Jonas Horst
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Removal of sampling clock jitter induced in an output signal of an...
- Patent number 9,954,546
- Issue date Apr 24, 2018
- Advantest Corporation
- Bernd Laquai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for source synchronous testing of signal conve...
- Patent number 9,300,309
- Issue date Mar 29, 2016
- Advantest Corporation
- Bernd Laquai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal distribution structure and method for distributing a signal
- Patent number 8,933,718
- Issue date Jan 13, 2015
- Advantest (Singapore) Pte Ltd
- Bernd Laquai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip tester, method for providing timing information, test fixture...
- Patent number 8,326,565
- Issue date Dec 4, 2012
- Advantest (Singapore) Pte Ltd
- Michael Daub
- G01 - MEASURING TESTING
Information Patent Grant
Parameterized signal conditioning
- Patent number 7,434,118
- Issue date Oct 7, 2008
- Verigy (Singapore) Pte. Ltd.
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Grant
Source synchronous sampling
- Patent number 7,355,378
- Issue date Apr 8, 2008
- Verigy (Singapore) Pte. Ltd.
- Markus Rottacker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing a device under test by sampling its clock and data signal
- Patent number 7,260,493
- Issue date Aug 21, 2007
- Verigy (Singapore) Pte. Ltd.
- Bernd Laquai
- G01 - MEASURING TESTING
Information Patent Grant
Polynomial fit for jitter separation
- Patent number 7,062,393
- Issue date Jun 13, 2006
- Agilent Technologies, Inc.
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Filter for injecting data dependent jitter and level noise
- Patent number 6,961,745
- Issue date Nov 1, 2005
- Agilent Technologies, Inc.
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TEST EQUIPMENT, METHOD FOR OPERATING A TEST EQUIPMENT AND COMPUTER...
- Publication number 20170322252
- Publication date Nov 9, 2017
- Advantest Corporation
- Bernd LAQUAI
- G01 - MEASURING TESTING
Information Patent Application
REMOVAL OF SAMPLING CLOCK JITTER INDUCED IN AN OUTPUT SIGNAL OF AN...
- Publication number 20170257107
- Publication date Sep 7, 2017
- Advantest Corporation
- Bernd Laquai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Automated Test Equipment for Testing a Device Under Test and Method...
- Publication number 20160169962
- Publication date Jun 16, 2016
- Advantest Corporation
- Jonas Horst
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SOURCE SYNCHRONOUS TESTING OF SIGNAL COVER...
- Publication number 20150288373
- Publication date Oct 8, 2015
- Bernd Laquai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL DISTRIBUTION STRUCTURE AND METHOD FOR DISTRIBUTING A SIGNAL
- Publication number 20110187399
- Publication date Aug 4, 2011
- Verigy (Singapore) Pte. Ltd.
- Bernd Laquai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP TESTER, METHOD FOR PROVIDING TIMING INFORMATION, TEST FIXTURE...
- Publication number 20110131000
- Publication date Jun 2, 2011
- Verigy (Singapore) Pte. Ltd.
- Michael Daub
- G01 - MEASURING TESTING
Information Patent Application
Parameterized Signal Conditioning
- Publication number 20080208510
- Publication date Aug 28, 2008
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Testing a device under test by sampling its clock and data signal
- Publication number 20060247881
- Publication date Nov 2, 2006
- AGILENT TECHNOLOGIES, INC.
- Bernd Laquai
- G01 - MEASURING TESTING
Information Patent Application
Spectral jitter analysis
- Publication number 20050243950
- Publication date Nov 3, 2005
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Spectral jitter analysis allowing jitter modulation waveform analysis
- Publication number 20050075810
- Publication date Apr 7, 2005
- AGILENT TECHNOLOGIES, INC.
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Parameterized signal conditioning
- Publication number 20040255213
- Publication date Dec 16, 2004
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Polynomial fit for jitter separation
- Publication number 20040250179
- Publication date Dec 9, 2004
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Filter for injecting data dependent jitter and level noise
- Publication number 20020174159
- Publication date Nov 21, 2002
- AGILENT TECHNOLOGIES, INC.
- Bernd Laquai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Bernd Laquai

Person

Patents Grantslast 30 patents

Test equipment, method for operating a test equipment and computer...

Automated test equipment for testing a device under test and method...

Removal of sampling clock jitter induced in an output signal of an...

Apparatus and method for source synchronous testing of signal conve...

Signal distribution structure and method for distributing a signal

Chip tester, method for providing timing information, test fixture...

Parameterized signal conditioning

Source synchronous sampling

Testing a device under test by sampling its clock and data signal

Polynomial fit for jitter separation

Filter for injecting data dependent jitter and level noise

Patents Applicationslast 30 patents

TEST EQUIPMENT, METHOD FOR OPERATING A TEST EQUIPMENT AND COMPUTER...

REMOVAL OF SAMPLING CLOCK JITTER INDUCED IN AN OUTPUT SIGNAL OF AN...

Automated Test Equipment for Testing a Device Under Test and Method...

APPARATUS AND METHOD FOR SOURCE SYNCHRONOUS TESTING OF SIGNAL COVER...

SIGNAL DISTRIBUTION STRUCTURE AND METHOD FOR DISTRIBUTING A SIGNAL

CHIP TESTER, METHOD FOR PROVIDING TIMING INFORMATION, TEST FIXTURE...

Parameterized Signal Conditioning

Testing a device under test by sampling its clock and data signal

Spectral jitter analysis

Spectral jitter analysis allowing jitter modulation waveform analysis

Parameterized signal conditioning

Polynomial fit for jitter separation

Filter for injecting data dependent jitter and level noise