Bernd Limburg

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Essenheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for quantitatively and/or qualitatively detecting layer thic...
- Patent number 7,396,684
- Issue date Jul 8, 2008
- Institut fur Mikrotechnik Mainz GmbH
- Wolfgang Ehrfeld
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for quantitatively and/or qualitatively detecting layer thic...
- Publication number 20050025676
- Publication date Feb 3, 2005
- Wolfgang Ehrfeld
- G01 - MEASURING TESTING