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Bernd Nawracala
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Karlsruhe, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Position detection based on two-directional correlation
Patent number
7,480,053
Issue date
Jan 20, 2009
Agilent Technologies, Inc.
Stefan Falk-Jordan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for absorbance detection
Patent number
6,775,002
Issue date
Aug 10, 2004
Agilent Technologies, Inc.
Bernd Nawracala
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating measuring setup for interference spectroscopy
Patent number
6,580,510
Issue date
Jun 17, 2003
Agilent Technologies Inc.
Bernd Nawracala
G01 - MEASURING TESTING
Information
Patent Grant
Microfluidic microchip with integrated substance injection
Patent number
6,495,016
Issue date
Dec 17, 2002
Agilent Technologies, Inc.
Bernd Nawracala
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Microtiter plate
Patent number
6,018,388
Issue date
Jan 25, 2000
Bernd Nawracala
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
Position detection based on two-directional correlation
Publication number
20070097357
Publication date
May 3, 2007
Stefan Falk-Jordan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Method of and apparatus for performing flow cytometric measurements
Publication number
20030073136
Publication date
Apr 17, 2003
Gerd Luedke
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for absorbance detection
Publication number
20020180974
Publication date
Dec 5, 2002
Bernd Nawracala
G01 - MEASURING TESTING
Information
Patent Application
Self-calibrating measuring setup for interference spectroscopy
Publication number
20010055118
Publication date
Dec 27, 2001
Bernd Nawracala
G01 - MEASURING TESTING