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Bernd Rieger
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Delft, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method for adjusting a stem equipped with an aberration corrector
Patent number
9,029,767
Issue date
May 12, 2015
FEI Company
Maarten Bischoff
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining distortions in a particle-optical apparatus
Patent number
8,885,973
Issue date
Nov 11, 2014
FEI Company
Bernd Rieger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for determining distortions in a particle-optical apparatus
Patent number
8,447,133
Issue date
May 21, 2013
FEI Company
Bernd Rieger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for determining the aberration coefficients of the aberratio...
Patent number
7,544,939
Issue date
Jun 9, 2009
FEI Company
Marinus Johannes van der Zande
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETERMINING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS
Publication number
20130266240
Publication date
Oct 10, 2013
FEI Company
Bernd Rieger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR ADJUSTING A STEM EQUIPPED WITH AN ABERRATION CORRECTOR
Publication number
20130105689
Publication date
May 2, 2013
FEI Company
Maarten Bischoff
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS
Publication number
20100246993
Publication date
Sep 30, 2010
FEI Company
Bernd Rieger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for determining the aberration coefficients of the aberratio...
Publication number
20070125945
Publication date
Jun 7, 2007
FEI Company
Marinus Johannes van der Zande
H01 - BASIC ELECTRIC ELEMENTS