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Bernd Widzgowski
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Dossenheim, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and signal generator for driving an acousto-optic element
Patent number
11,686,994
Issue date
Jun 27, 2023
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for evaluating a single-photon detector signal
Patent number
11,262,465
Issue date
Mar 1, 2022
Leica Microsystems CMS GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electric circuit and method for driving an acousto-optic crystal
Patent number
11,215,853
Issue date
Jan 4, 2022
Leica Microsystems CMS GmbH
Bernd Widzgowski
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for counting photons by means of a photomultiplier
Patent number
11,215,503
Issue date
Jan 4, 2022
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence-lifetime imaging microscopy method having time-correla...
Patent number
11,086,119
Issue date
Aug 10, 2021
Leica Microsystems CMS GmbH
Frank Hecht
G02 - OPTICS
Information
Patent Grant
Method for forming a digital value from a clock signal and from a d...
Patent number
10,824,116
Issue date
Nov 3, 2020
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Light/voltage converter circuit for converting intensity fluctuatio...
Patent number
10,627,285
Issue date
Apr 21, 2020
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence lifetime imaging microscopy method having time-correla...
Patent number
10,520,434
Issue date
Dec 31, 2019
Leica Microsystems CMS GmbH
Volker Seyfried
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring the lifetime of an excited state in a sample
Patent number
10,073,034
Issue date
Sep 11, 2018
Leica Microsystems CMS GmbH
Bernd Widzgowski
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement for use in the illumination of a specimen in SPIM micro...
Patent number
9,772,481
Issue date
Sep 26, 2017
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Grant
Confocal laser scanning microscope having a laser light source to w...
Patent number
9,575,300
Issue date
Feb 21, 2017
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Method and apparatus for examining a sample
Patent number
9,476,766
Issue date
Oct 25, 2016
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Detector apparatus
Patent number
9,450,118
Issue date
Sep 20, 2016
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microscope and a method for examining a sample using a microscope
Patent number
9,411,141
Issue date
Aug 9, 2016
Leica Microsystems CMS GmbH
Frank Schreiber
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for investigating a sample with regard to the...
Patent number
9,274,057
Issue date
Mar 1, 2016
Leica Microsystems CMS GmbH
Juergen Schneider
G01 - MEASURING TESTING
Information
Patent Grant
Phase filters for a scanning microscope
Patent number
9,250,429
Issue date
Feb 2, 2016
Leica Microsystems CMS GmbH
Hilmar Gugel
G02 - OPTICS
Information
Patent Grant
Detector apparatus having a cooling component
Patent number
9,130,079
Issue date
Sep 8, 2015
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector apparatus having a cooling component
Patent number
9,117,947
Issue date
Aug 25, 2015
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning microscope and method for optically scanning one or more s...
Patent number
9,042,010
Issue date
May 26, 2015
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Device for scanning an object, method for operating the device and...
Patent number
9,036,232
Issue date
May 19, 2015
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Grant
Detector apparatus including light sensor and active cooling compon...
Patent number
8,791,402
Issue date
Jul 29, 2014
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for examining an object using a microscope with delayed cont...
Patent number
8,735,790
Issue date
May 27, 2014
Leica Microsystems CMS GmbH
Ludger Schulte
G02 - OPTICS
Information
Patent Grant
Acousto-optical system, microscope and method of use of the acousto...
Patent number
8,681,412
Issue date
Mar 25, 2014
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Method and device for scanning-microscopy imaging of a specimen
Patent number
8,542,439
Issue date
Sep 24, 2013
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for counting photons
Patent number
8,497,463
Issue date
Jul 30, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
G01 - MEASURING TESTING
Information
Patent Grant
Optical evaluation method by means of laser pulses and correspondin...
Patent number
8,253,937
Issue date
Aug 28, 2012
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G01 - MEASURING TESTING
Information
Patent Grant
Method for illuminating a sample
Patent number
7,676,071
Issue date
Mar 9, 2010
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Scanning microscope with scanner frequency derived from pulsed laser
Patent number
7,554,722
Issue date
Jun 30, 2009
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Apparatus and method for detection with a scanning microscope
Patent number
7,495,236
Issue date
Feb 24, 2009
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Scanning microscope
Patent number
7,492,511
Issue date
Feb 17, 2009
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
DATA PROCESSING APPARATUS FOR A DIGITAL IMAGING DEVICE, MICROSCOPE...
Publication number
20240280798
Publication date
Aug 22, 2024
Leica Microsystems CMS GmbH
Falk SCHLAUDRAFF
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND APPARATUS CONFIGURED TO COUNT N-PHOTON EVENTS
Publication number
20230175886
Publication date
Jun 8, 2023
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
FLUORESCENCE-LIFETIME IMAGING MICROSCOPY METHOD HAVING TIME-CORRELA...
Publication number
20200400933
Publication date
Dec 24, 2020
Leica Microsystems CMS GmbH
Frank HECHT
G02 - OPTICS
Information
Patent Application
METHOD FOR COUNTING PHOTONS BY MEANS OF A PHOTOMULTIPLIER
Publication number
20200386616
Publication date
Dec 10, 2020
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SIGNAL GENERATOR FOR DRIVING AN ACOUSTO-OPTIC ELEMENT
Publication number
20200192182
Publication date
Jun 18, 2020
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
METHOD FOR EVALUATING A SINGLE-PHOTON DETECTOR SIGNAL
Publication number
20200103538
Publication date
Apr 2, 2020
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
METHOD FOR FORMING A DIGITAL VALUE FROM A CLOCK SIGNAL AND FROM A D...
Publication number
20200041961
Publication date
Feb 6, 2020
Leica Microsystems CMS GmbH
Bernd Widzgowski
G04 - HOROLOGY
Information
Patent Application
FLUORESCENCE LIFETIME IMAGING MICROSCOPY METHOD HAVING TIME-CORRELA...
Publication number
20190339201
Publication date
Nov 7, 2019
Leica Microsystems CMS GmbH
Volker SEYFRIED
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ARRANGEMENT FOR PULSED ILLUMINATION, METHOD FOR PULSED ILLU...
Publication number
20190339500
Publication date
Nov 7, 2019
Leica Microsystems CMS GmbH
Bernd WIDZGOWSKI
G02 - OPTICS
Information
Patent Application
LIGHT/VOLTAGE CONVERTER CIRCUIT FOR CONVERTING INTENSITY FLUCTUATIO...
Publication number
20190086257
Publication date
Mar 21, 2019
Leica Microsystems CMS GmbH
Vishnu Vardhan KRISHNAMACHARI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC CIRCUIT AND METHOD FOR DRIVING AN ACOUSTO-OPTIC CRYSTAL
Publication number
20190041671
Publication date
Feb 7, 2019
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROSCOPE AND A METHOD FOR EXAMINING A SAMPLE USING A MICROSCOPE
Publication number
20150286040
Publication date
Oct 8, 2015
Leica Microsystems CMS GmbH
Frank Schreiber
G02 - OPTICS
Information
Patent Application
CONFOCAL LASER SCANNING MICROSCOPE HAVING A LASER LIGHT SOURCE TO W...
Publication number
20150212306
Publication date
Jul 30, 2015
Leica Microsystems CMS Gmbh
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
Method and Apparatus for Investigating a Sample with Regard to the...
Publication number
20150123013
Publication date
May 7, 2015
Leica Microsystems CMS GmbH
Juergen Schneider
G02 - OPTICS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20140306098
Publication date
Oct 16, 2014
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ARRANGEMENT FOR USE IN THE ILLUMINATION OF A SPECIMEN IN SPIM MICRO...
Publication number
20140300958
Publication date
Oct 9, 2014
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Method and Apparatus for Examining a Sample
Publication number
20130140437
Publication date
Jun 6, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
Method for Measuring the Lifetime of an Excited State in a Sample
Publication number
20130119276
Publication date
May 16, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR DEVICE
Publication number
20130043376
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20130043377
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20130043378
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR SCANNING AN OBJECT AND A MICROSCOPE
Publication number
20130044370
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Volker Seyfried
G02 - OPTICS
Information
Patent Application
DEVICE AND METHOD FOR COUNTING PHOTONS
Publication number
20130032699
Publication date
Feb 7, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR SCANNING AN OBJECT, METHOD FOR OPERATING THE DEVICE AND...
Publication number
20130010340
Publication date
Jan 10, 2013
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
SCANNING MICROSCOPE AND METHOD FOR OPTICALLY SCANNING ONE OR MORE S...
Publication number
20130003172
Publication date
Jan 3, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
Phase Filters for a Scanning Microscope
Publication number
20120236398
Publication date
Sep 20, 2012
Leica Microsystems CMS GmbH
Hilmar GUGEL
G02 - OPTICS
Information
Patent Application
LASER SYSTEM FOR A MICROSCOPE AND METHOD FOR OPERATING A LASER SYST...
Publication number
20120193513
Publication date
Aug 2, 2012
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
Method and Device for Scanning-Microscopy Imaging of a Specimen
Publication number
20120175505
Publication date
Jul 12, 2012
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
ACOUSTO-OPTICAL SYSTEM, MICROSCOPE AND METHOD OF USE OF THE ACOUSTO...
Publication number
20110304900
Publication date
Dec 15, 2011
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Application
METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A M...
Publication number
20110149290
Publication date
Jun 23, 2011
Leica Microsystems CMS GmbH
Ludger Schulte
G02 - OPTICS