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Bernhard Ostrick
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Teltow, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor element and method for producing a sensor element
Patent number
12,320,716
Issue date
Jun 3, 2025
TDK ELECTRONICS AG
Anke Weidenfelder
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor element and method for producing a sensor element
Patent number
12,287,246
Issue date
Apr 29, 2025
TDK ELECTRONICS AG
Anke Weidenfelder
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Film resistor and thin-film sensor with a piezoresistive layer
Patent number
11,676,743
Issue date
Jun 13, 2023
TDK ELECTRONICS AG
Bettina Milke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Film resistor and thin-film sensor
Patent number
11,177,059
Issue date
Nov 16, 2021
TDK ELECTRONICS AG
Bettina Milke
G01 - MEASURING TESTING
Information
Patent Grant
Compact sensor module for a combination of pressure, humidity and/o...
Patent number
10,670,548
Issue date
Jun 2, 2020
EPCOS AG
Bernhard Ostrick
G01 - MEASURING TESTING
Information
Patent Grant
Device, arrangement, and method for measuring a current intensity i...
Patent number
10,018,656
Issue date
Jul 10, 2018
Epcos AG
Bernhard Ostrick
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor system
Patent number
9,909,946
Issue date
Mar 6, 2018
EPCOS AG
Jan Ihle
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-measuring device
Patent number
8,177,425
Issue date
May 15, 2012
EPCOS AG
Wolfgang Grundmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST ARRANGEMENT AND TEMPERATURE SENSOR
Publication number
20240219245
Publication date
Jul 4, 2024
TDK Electronics AG
Markus Wehring
G01 - MEASURING TESTING
Information
Patent Application
Sensor Element and Method for Producing a Sensor Element
Publication number
20220357214
Publication date
Nov 10, 2022
TDK Electronics AG
Anke Weidenfelder
G01 - MEASURING TESTING
Information
Patent Application
Film Resistor and Thin-Film Sensor
Publication number
20200118721
Publication date
Apr 16, 2020
TDK Electronics AG
Bettina Milke
G01 - MEASURING TESTING
Information
Patent Application
Film Resistor and Thin-Film Sensor
Publication number
20200118719
Publication date
Apr 16, 2020
TDK Electronics AG
Bettina Milke
G01 - MEASURING TESTING
Information
Patent Application
MEMS Yaw-Rate Sensor
Publication number
20180292211
Publication date
Oct 11, 2018
EPCOS AG
Marcus Besson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Sensor
Publication number
20170184687
Publication date
Jun 29, 2017
EPCOS AG
Bernhard Ostrick
G01 - MEASURING TESTING
Information
Patent Application
Pressure Sensor System
Publication number
20170089796
Publication date
Mar 30, 2017
EPCOS AG
Jan IHLE
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Application
Device, Arrangement, and Method for Measuring a Current Intensity i...
Publication number
20160266172
Publication date
Sep 15, 2016
EPCOS AG
Bernhard Ostrick
G01 - MEASURING TESTING
Information
Patent Application
Sensor Module and Method for Producing the Sensor Module
Publication number
20160069831
Publication date
Mar 10, 2016
EPCOS AG
Bernhard Ostrick
G01 - MEASURING TESTING
Information
Patent Application
Sensor System Comprising a Ceramic Housing
Publication number
20160013112
Publication date
Jan 14, 2016
EPCOS AG
Jan Ihle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pressure Sensor System
Publication number
20150377734
Publication date
Dec 31, 2015
EPCOS AG
Jan IHLE
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Application
Micromechanical Measuring Element
Publication number
20150047435
Publication date
Feb 19, 2015
Bernhard Ostrick
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PIEZORESISTIVE PRESSURE SENSOR AND PROCESS FOR PRODUCING A PIEZORES...
Publication number
20130015537
Publication date
Jan 17, 2013
EPCOS AG
Birgit Nowak
G01 - MEASURING TESTING
Information
Patent Application
Temperature-Measuring Device
Publication number
20090193887
Publication date
Aug 6, 2009
Wolfgang Grundmann
G01 - MEASURING TESTING