Bernhard Ruf

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Taufkirchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit, test structure and method for testing integrate...
- Patent number 6,618,303
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Arndt Gruber
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and arrangement for repairing memory chips using microlithog...
- Publication number 20070066367
- Publication date Mar 22, 2007
- Jochen Kallscheuer
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit, test structure and method for testing integrate...
- Publication number 20020020854
- Publication date Feb 21, 2002
- Arndt Gruber
- G11 - INFORMATION STORAGE