Bernhard SCHÜLER

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for automated critical dimension measurement on a substrate...
- Patent number 11,687,008
- Issue date Jun 27, 2023
- Applied Materials, Inc.
- Bernhard G. Mueller
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of automatically focusing a charged particle beam on a surfa...
- Patent number 11,610,755
- Issue date Mar 21, 2023
- Applied Materials, Inc.
- Robert Trauner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of automatically focusing a charged particle beam on a surfa...
- Patent number 11,195,691
- Issue date Dec 7, 2021
- Applied Materials, Inc.
- Robert Trauner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a sample with a charged particle beam device,...
- Patent number 10,345,250
- Issue date Jul 9, 2019
- Applied Materials, Inc.
- Bernhard G. Mueller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF IMAGING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE, MET...
- Publication number 20230253177
- Publication date Aug 10, 2023
- Applied Materials, Inc.
- Kulpreet Singh VIRDI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...
- Publication number 20220044907
- Publication date Feb 10, 2022
- Applied Materials, Inc.
- Robert TRAUNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR AUTOMATED CRITICAL DIMENSION MEASUREMENT ON A SUBSTRATE...
- Publication number 20210373444
- Publication date Dec 2, 2021
- Applied Materials, Inc.
- Bernhard G. MUELLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFA...
- Publication number 20210249220
- Publication date Aug 12, 2021
- Applied Materials, Inc.
- Robert TRAUNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20190113470
- Publication date Apr 18, 2019
- Applied Materials, Inc.
- Bernhard G. MUELLER
- H01 - BASIC ELECTRIC ELEMENTS