Bert Henning Freitag

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope scan masking for three-dimensional reco...
- Patent number 11,741,730
- Issue date Aug 29, 2023
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 11,488,800
- Issue date Nov 1, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous phase contrast imaging and elect...
- Patent number 11,211,223
- Issue date Dec 28, 2021
- FEI Company
- Ivan Lazić
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for RF pulsed electron beam based STEM
- Patent number 11,127,562
- Issue date Sep 21, 2021
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with imaging beam rotation
- Patent number 10,224,174
- Issue date Mar 5, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mounting structures for multi-detector electron microscopes
- Patent number 8,993,963
- Issue date Mar 31, 2015
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous electron detection
- Patent number 8,859,966
- Issue date Oct 14, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,592,764
- Issue date Nov 26, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,410,439
- Issue date Apr 2, 2013
- PEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Contrast for scanning confocal electron microscope
- Patent number 8,405,027
- Issue date Mar 26, 2013
- FEI Company
- Sorin Lazar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a sample
- Patent number 8,389,936
- Issue date Mar 5, 2013
- FEI Company
- Bert Henning Freitag
- G01 - MEASURING TESTING
Information Patent Grant
Method of machining a work piece with a focused particle beam
- Patent number 8,168,948
- Issue date May 1, 2012
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector for electron microscope
- Patent number 8,080,791
- Issue date Dec 20, 2011
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Grant
Method for obtaining a scanning transmission image of a sample in a...
- Patent number 7,825,378
- Issue date Nov 2, 2010
- FEI Company
- Alevtyna Yakushevska
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining lens errors in a particle-optical device
- Patent number 7,518,121
- Issue date Apr 14, 2009
- FEI Company
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20230035267
- Publication date Feb 2, 2023
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE SCAN MASKING FOR THREE-DIMENSIONAL RECO...
- Publication number 20220414361
- Publication date Dec 29, 2022
- FEI Company
- Pavel POTOCEK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20220310353
- Publication date Sep 29, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mounting structures for multi-detector electron microscopes
- Publication number 20140319347
- Publication date Oct 30, 2014
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20140077080
- Publication date Mar 20, 2014
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
- Publication number 20130240731
- Publication date Sep 19, 2013
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
X-ray Detector for Electron Microscope
- Publication number 20120074333
- Publication date Mar 29, 2012
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
Contrast for Scanning Confocal Electron Microscope
- Publication number 20120012747
- Publication date Jan 19, 2012
- FEI Company
- Sorin Lazar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simultaneous Electron Detection
- Publication number 20110278451
- Publication date Nov 17, 2011
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Inspecting a Sample
- Publication number 20110006208
- Publication date Jan 13, 2011
- FEI Company
- Bert Henning Freitag
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
- Publication number 20100148064
- Publication date Jun 17, 2010
- FEI Company
- Hanno Sebastian von Harrach
- G01 - MEASURING TESTING
Information Patent Application
Method of Machining a Work Piece with a Focused Particle Beam
- Publication number 20100032567
- Publication date Feb 11, 2010
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING A SCANNING TRANSMISSION IMAGE OF A SAMPLE IN A...
- Publication number 20090133167
- Publication date May 21, 2009
- FEI Company
- Alevtyna Yakushevska
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining lens errors in a particle-optical device
- Publication number 20070045558
- Publication date Mar 1, 2007
- FEI Company
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS

Bert Henning Freitag

Person

Patents Grantslast 30 patents

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Charged particle microscope scan masking for three-dimensional reco...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

System and method for simultaneous phase contrast imaging and elect...

System and method for RF pulsed electron beam based STEM

EELS detection technique in an electron microscope

Transmission charged particle microscope with imaging beam rotation

Mounting structures for multi-detector electron microscopes

Simultaneous electron detection

X-ray detector for electron microscope

X-ray detector for electron microscope

Contrast for scanning confocal electron microscope

Method for inspecting a sample

Method of machining a work piece with a focused particle beam

X-ray detector for electron microscope

Method for obtaining a scanning transmission image of a sample in a...

Method for determining lens errors in a particle-optical device

Patents Applicationslast 30 patents

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

CHARGED PARTICLE MICROSCOPE SCAN MASKING FOR THREE-DIMENSIONAL RECO...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

Mounting structures for multi-detector electron microscopes

X-ray Detector for Electron Microscope

X-RAY DETECTOR FOR ELECTRON MICROSCOPE

X-ray Detector for Electron Microscope

Contrast for Scanning Confocal Electron Microscope

Simultaneous Electron Detection

Method for Inspecting a Sample

X-RAY DETECTOR FOR ELECTRON MICROSCOPE

Method of Machining a Work Piece with a Focused Particle Beam

METHOD FOR OBTAINING A SCANNING TRANSMISSION IMAGE OF A SAMPLE IN A...

Method for determining lens errors in a particle-optical device