Berthold MICHELT

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Wiesbaden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optical measuring method and measuring device having a measuring he...
- Patent number 9,982,994
- Issue date May 29, 2018
- Precitec Optronik Gmbh
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring method and measuring device having a measuring he...
- Patent number 9,677,871
- Issue date Jun 13, 2017
- Precitec Optronik GmbH
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and method for acquiring in situ a stage h...
- Patent number 9,500,471
- Issue date Nov 22, 2016
- Precitec Optronik Gmbh
- Berthold Michelt
- G01 - MEASURING TESTING
Information Patent Grant
Test device for testing a bonding layer between wafer-shaped sample...
- Patent number 9,494,409
- Issue date Nov 15, 2016
- Precitec Optronik Gmbh
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring apparatus and method for in-situ measurement of wafer th...
- Patent number 8,716,039
- Issue date May 6, 2014
- Precitec Optronik GmbH
- Claus Dusemund
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASURING METHOD AND MEASURING DEVICE HAVING A MEASURING HE...
- Publication number 20170234678
- Publication date Aug 17, 2017
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING METHOD AND MEASURING DEVICE HAVING A MEASURING HE...
- Publication number 20150260504
- Publication date Sep 17, 2015
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Application
Optical Measurement Device for Detecting Distance Differences and O...
- Publication number 20140368830
- Publication date Dec 18, 2014
- PRECITEC OPTRONIK GMBH
- Berthold MICHELT
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD FOR IN-SITU MEASUREMENT OF WAFER TH...
- Publication number 20130034918
- Publication date Feb 7, 2013
- DUSEMUND PTE. LTD
- Claus Dusemund
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR TESTING A BONDING LAYER BETWEEN WAFER-SHAPED SAMPLE...
- Publication number 20120320380
- Publication date Dec 20, 2012
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- G01 - MEASURING TESTING
Information Patent Application
Device and method for the contactless measurement of at least one c...
- Publication number 20070242279
- Publication date Oct 18, 2007
- Berthold Michelt
- G01 - MEASURING TESTING