Bertrand Simon Lanher

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for measuring trace contaminants in gas matrix...
- Patent number 11,994,465
- Issue date May 28, 2024
- ABB Schweiz AG
- François Tanguay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR MEASURING TRACE CONTAMINANTS IN GAS MATRIX...
- Publication number 20230417663
- Publication date Dec 28, 2023
- ABB SCHWEIZ AG
- François Tanguay
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING TRACE CONTAMINANTS IN GAS MATRIX...
- Publication number 20230417597
- Publication date Dec 28, 2023
- ABB Schweiz AG
- François Tanguay
- G01 - MEASURING TESTING