Bharani Thiruvengadam

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Alternating current coupled electronic component test system and me...
- Patent number 9,658,288
- Issue date May 23, 2017
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Current tests for I/O interface connectors
- Patent number 9,551,741
- Issue date Jan 24, 2017
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Duty cycle based timing margining for I/O AC timing
- Patent number 9,535,119
- Issue date Jan 3, 2017
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Testing I/O timing defects for high pin count, non-contact interfaces
- Patent number 9,501,376
- Issue date Nov 22, 2016
- Intel Corporation
- Christopher Nelson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alternating current coupled electronic component test system and me...
- Patent number 9,389,274
- Issue date Jul 12, 2016
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Pulse width modulator for high speed digitally controlled voltage r...
- Patent number 9,385,698
- Issue date Jul 5, 2016
- Intel Corporation
- Harish K. Krishnamurthy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...
- Publication number 20160320447
- Publication date Nov 3, 2016
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
PULSE WIDTH MODULATOR FOR HIGH SPEED DIGITALLY CONTROLLED VOLTAGE R...
- Publication number 20160118967
- Publication date Apr 28, 2016
- Harish K. KRISHNAMURTHY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUTY CYCLE BASED TIMING MARGINING FOR I/O AC TIMING
- Publication number 20150377967
- Publication date Dec 31, 2015
- BHARANI THIRUVENGADAM
- G01 - MEASURING TESTING
Information Patent Application
TESTING I/O TIMING DEFECTS FOR HIGH PIN COUNT, NON-CONTACT INTERFACES
- Publication number 20150324265
- Publication date Nov 12, 2015
- CHRISTOPHER NELSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...
- Publication number 20150084642
- Publication date Mar 26, 2015
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
CURRENT TESTS FOR I/O INTERFACE CONNECTORS
- Publication number 20130271167
- Publication date Oct 17, 2013
- Bharani Thiruvengadam
- G01 - MEASURING TESTING