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Bharath K. Narahari
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Spring Lake, MN, US
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last 30 patents
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Patent Grant
System and method for measuring narrow and wide angle light scatter...
Patent number
9,176,055
Issue date
Nov 3, 2015
Sony Corporation
Michael D. Zordan
G01 - MEASURING TESTING
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last 30 patents
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SYSTEM AND METHOD FOR MEASURING NARROW AND WIDE ANGLE LIGHT SCATTER...
Publication number
20130169953
Publication date
Jul 4, 2013
SONY CORPORATION of AMERICA
Michael D. Zordan
G01 - MEASURING TESTING