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Bhaskar Jyoti Krishnatreya
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Astoria, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Fast feature identification for holographic tracking and characteri...
Patent number
10,983,041
Issue date
Apr 20, 2021
New York University
Aaron Yevick
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Holographic microrefractometer for determining refractive index of...
Patent number
9,188,529
Issue date
Nov 17, 2015
New York University
Hagay Shpaisman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
FAST FEATURE IDENTIFICATION FOR HOLOGRAPHIC TRACKING AND CHARACTERI...
Publication number
20170059468
Publication date
Mar 2, 2017
NEW YORK UNIVERSITY
Aaron Yevick
G01 - MEASURING TESTING
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Patent Application
HOLOGRAPHIC MICROREFRACTOMETER
Publication number
20150062587
Publication date
Mar 5, 2015
NEW YORK UNIVERSITY
Hagay Shpaisman
G02 - OPTICS