Bhavana Bhoovaraghan

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Fishkill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Leakage measurement of through silicon vias
- Patent number 8,835,194
- Issue date Sep 16, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage measurement structure having through silicon vias
- Patent number 8,692,246
- Issue date Apr 8, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS
- Publication number 20140065738
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS
- Publication number 20130069062
- Publication date Mar 21, 2013
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS