Bicheng Liu

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for correcting a scanned image and image scanning...
- Patent number 11,812,002
- Issue date Nov 7, 2023
- Bicheng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image data processing method, device and security inspection system...
- Patent number 11,699,223
- Issue date Jul 11, 2023
- Nuctech Company Limited
- Ziran Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Back scattering inspection system and back scattering inspection me...
- Patent number 11,614,413
- Issue date Mar 28, 2023
- Jianmin Li
- G01 - MEASURING TESTING
Information Patent Grant
Spiral CT device and Three-dimensional image reconstruction method
- Patent number 11,346,975
- Issue date May 31, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-energy-spectrum X-ray imaging system and method of substance...
- Patent number 11,112,528
- Issue date Sep 7, 2021
- Nuctech Company Limited
- Guangming Xu
- G01 - MEASURING TESTING
Information Patent Grant
Security inspection based on scanned images
- Patent number 11,055,869
- Issue date Jul 6, 2021
- Bicheng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method, device, and computer readable storage medium
- Patent number 10,884,156
- Issue date Jan 5, 2021
- Qi Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor detector and method for packaging the same
- Patent number 10,670,743
- Issue date Jun 2, 2020
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses for processing signals for a plurality of energy region...
- Patent number 10,663,607
- Issue date May 26, 2020
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-energy spectrum x-ray imaging systems and methods for recogni...
- Patent number 10,646,179
- Issue date May 12, 2020
- Nuctech Company Limited
- Guangming Xu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method, device and system for inspecting moving object based on cos...
- Patent number 10,620,336
- Issue date Apr 14, 2020
- Tsinghua University
- Kejun Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and system for inspecting object based on cosmic ray
- Patent number 10,613,247
- Issue date Apr 7, 2020
- Tsinghua University
- Kejun Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection devices and methods for inspecting a container
- Patent number 10,586,324
- Issue date Mar 10, 2020
- Nuctech Company Limited
- Ziran Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decomposition method and apparatus based on basis material combination
- Patent number 10,448,904
- Issue date Oct 22, 2019
- Tsinghua University
- Liang Li
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Semiconductor detector
- Patent number 10,388,818
- Issue date Aug 20, 2019
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor detector
- Patent number 10,295,679
- Issue date May 21, 2019
- Nuctech Company Limited
- Lan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-energy ray scanning system, scanning method and inspecting system
- Patent number 10,285,252
- Issue date May 7, 2019
- Nuctech Company Limited
- Yu Hu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor detector
- Patent number 10,101,473
- Issue date Oct 16, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
MOBILE RADIATION INSPECTION APPARATUS AND MOBILE RADIATION INSPECTI...
- Publication number 20240411045
- Publication date Dec 12, 2024
- NUCTECH (BEIJING) COMPANY LIMITED
- Shangmin SUN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319114
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
RADIATION INSPECTION SYSTEM AND METHOD
- Publication number 20240312753
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240302299
- Publication date Sep 12, 2024
- Nuctech Company Limited
- Weizhen WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
- Publication number 20230288350
- Publication date Sep 14, 2023
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CORRECTING A SCANNED IMAGE AND IMAGE SCANNING...
- Publication number 20220030132
- Publication date Jan 27, 2022
- Nuctech Company Limited
- Bicheng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BACK SCATTERING INSPECTION SYSTEM AND BACK SCATTERING INSPECTION ME...
- Publication number 20210364455
- Publication date Nov 25, 2021
- TSINGHUA UNIVERSITY
- Jianmin LI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...
- Publication number 20210025836
- Publication date Jan 28, 2021
- TSINGHUA UNIVERSITY
- Zhi ZENG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ENERGY-SPECTRUM X-RAY IMAGING SYSTEM AND METHOD OF SUBSTANCE...
- Publication number 20200309987
- Publication date Oct 1, 2020
- Nuctech Company Limited
- Guangming XU
- G01 - MEASURING TESTING
Information Patent Application
SPIRAL CT DEVICE AND THREE-DIMENSIONAL IMAGE RECONSTRUCTION METHOD
- Publication number 20190317240
- Publication date Oct 17, 2019
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
DECOMPOSITION METHOD AND APPARATUS BASED ON BASIS MATERIAL COMBINATION
- Publication number 20190192090
- Publication date Jun 27, 2019
- TSINGHUA UNIVERSITY
- Liang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS AND SYSTEM FOR ASSISTING SECURITY INSPECTION
- Publication number 20190197721
- Publication date Jun 27, 2019
- Nuctech Company Limited
- Bicheng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD, DEVICE, AND COMPUTER READABLE STORAGE MEDIUM
- Publication number 20190196051
- Publication date Jun 27, 2019
- Nuctech Company Limited
- Qi WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE DATA PROCESSING METHOD, DEVICE AND SECURITY INSPECTION SYSTEM...
- Publication number 20180189945
- Publication date Jul 5, 2018
- Nuctech Company Limited
- Ziran Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICES AND METHODS FOR INSPECTING A CONTAINER
- Publication number 20180182085
- Publication date Jun 28, 2018
- Nuctech Company Limited
- Ziran Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICES AND INSPECTION METHODS
- Publication number 20180156741
- Publication date Jun 7, 2018
- Nuctech Company Limited
- Kejun Kang
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ENERGY SPECTRUM X-RAY IMAGING SYSTEMS AND METHODS FOR RECOGNI...
- Publication number 20180153493
- Publication date Jun 7, 2018
- Nuctech Company Limited
- Guangming XU
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR DETECTOR AND METHOD FOR PACKAGING THE SAME
- Publication number 20180059265
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180059261
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180059262
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180062021
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES FOR PROCESSING SIGNALS FOR A PLURALITY OF ENERGY REGION...
- Publication number 20180059269
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR, AND DETECTING SYSTEM AND METHOD FOR DIVIDING ENERGY REGIO...
- Publication number 20180059264
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS AND SYSTEM FOR INSPECTING OBJECT BASED ON COSMIC RAY
- Publication number 20170329038
- Publication date Nov 16, 2017
- TSINGHUA UNIVERSITY
- Kejun KANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR INSPECTING MOVING OBJECT BASED ON COS...
- Publication number 20170329039
- Publication date Nov 16, 2017
- TSINGHUA UNIVERSITY
- Kejun KANG
- G01 - MEASURING TESTING
Information Patent Application
DUAL-ENERGY RAY SCANNING SYSTEM, SCANNING METHOD AND INSPECTING SYSTEM
- Publication number 20170094762
- Publication date Mar 30, 2017
- Nuctech Company Limited
- Yu Hu
- G01 - MEASURING TESTING

Bicheng Liu

Person

Patents Grantslast 30 patents

Method and device for correcting a scanned image and image scanning...

Image data processing method, device and security inspection system...

Substance identification device and method for extracting statistic...

Back scattering inspection system and back scattering inspection me...

Spiral CT device and Three-dimensional image reconstruction method

Multi-energy-spectrum X-ray imaging system and method of substance...

Security inspection based on scanned images

Image processing method, device, and computer readable storage medium

Semiconductor detector and method for packaging the same

Apparatuses for processing signals for a plurality of energy region...

Multi-energy spectrum x-ray imaging systems and methods for recogni...

Method, device and system for inspecting moving object based on cos...

Method, apparatus and system for inspecting object based on cosmic ray

Inspection devices and methods for inspecting a container

Decomposition method and apparatus based on basis material combination

Semiconductor detector

Semiconductor detector

Dual-energy ray scanning system, scanning method and inspecting system

Semiconductor detector

Patents Applicationslast 30 patents

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

MOBILE RADIATION INSPECTION APPARATUS AND MOBILE RADIATION INSPECTI...

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

RADIATION INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM

METHOD AND DEVICE FOR CORRECTING A SCANNED IMAGE AND IMAGE SCANNING...

BACK SCATTERING INSPECTION SYSTEM AND BACK SCATTERING INSPECTION ME...

SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...

MULTI-ENERGY-SPECTRUM X-RAY IMAGING SYSTEM AND METHOD OF SUBSTANCE...

SPIRAL CT DEVICE AND THREE-DIMENSIONAL IMAGE RECONSTRUCTION METHOD

DECOMPOSITION METHOD AND APPARATUS BASED ON BASIS MATERIAL COMBINATION

METHOD, APPARATUS AND SYSTEM FOR ASSISTING SECURITY INSPECTION

IMAGE PROCESSING METHOD, DEVICE, AND COMPUTER READABLE STORAGE MEDIUM

IMAGE DATA PROCESSING METHOD, DEVICE AND SECURITY INSPECTION SYSTEM...

INSPECTION DEVICES AND METHODS FOR INSPECTING A CONTAINER

INSPECTION DEVICES AND INSPECTION METHODS

MULTI-ENERGY SPECTRUM X-RAY IMAGING SYSTEMS AND METHODS FOR RECOGNI...

SEMICONDUCTOR DETECTOR AND METHOD FOR PACKAGING THE SAME

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DETECTOR

APPARATUSES FOR PROCESSING SIGNALS FOR A PLURALITY OF ENERGY REGION...

DETECTOR, AND DETECTING SYSTEM AND METHOD FOR DIVIDING ENERGY REGIO...

METHOD, APPARATUS AND SYSTEM FOR INSPECTING OBJECT BASED ON COSMIC RAY

METHOD, DEVICE AND SYSTEM FOR INSPECTING MOVING OBJECT BASED ON COS...

DUAL-ENERGY RAY SCANNING SYSTEM, SCANNING METHOD AND INSPECTING SYSTEM