Biju Parameshwaran

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test device for determining charge damage to a transistor
- Patent number 7,804,317
- Issue date Sep 28, 2010
- Advanced Micro Devices, Inc.
- Biju Parameshwaran
- G01 - MEASURING TESTING
Information Patent Grant
Methods for fabricating magnetic cell junctions and a structure res...
- Patent number 7,205,164
- Issue date Apr 17, 2007
- Silicon Magnetic Systems
- Sam Geha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for...
- Patent number 6,969,689
- Issue date Nov 29, 2005
- Krishnaswamy Ramkumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for and structure formed from fabricating a relatively deep...
- Patent number 6,794,269
- Issue date Sep 21, 2004
- Cypress Semiconductor Corp.
- Prabhuram Gopalan
- H01 - BASIC ELECTRIC ELEMENTS