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Bikash Kumar Agarwal
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Bangalore, IN
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last 30 patents
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Patent Grant
Scan warmup scheme for mitigating di/dt during scan test
Patent number
9,291,676
Issue date
Mar 22, 2016
Advanced Micro Devices, Inc.
Atchyuth K Gorti
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Scan Warmup Scheme for Mitigating DI/DT During Scan Test
Publication number
20140237312
Publication date
Aug 21, 2014
Advanced Micro Devices, Inc.
Atchyuth K. Gorti
G01 - MEASURING TESTING