Bill Sejer Nielsen

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Hammel, DK

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Patents Grantslast 30 patents

Information Patent Grant
System and method for the measurement of the layer thickness of a m...
- Patent number 7,092,486
- Issue date Aug 15, 2006
- Sciteq-Hammel A/S
- Finn Fallentin Olesen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for the measurement of the layer thickness of a m...
- Publication number 20060098774
- Publication date May 11, 2006
- Finn Fallentin Olesen
- G01 - MEASURING TESTING
Information Patent Application
System and method for the measurement of the layer thickness of a m...
- Publication number 20040234027
- Publication date Nov 25, 2004
- Finn Fallentin Olesen
- G01 - MEASURING TESTING