Binbin XU

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Jiangsu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Circuit and method for post-binding testing of 2.5D chiplet
- Patent number 12,188,984
- Issue date Jan 7, 2025
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Serial test circuit for controllable Chiplets
- Patent number 12,135,354
- Issue date Nov 5, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
FCM based chiplet test circuit
- Patent number 12,099,086
- Issue date Sep 24, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SERIAL TEST CIRCUIT FOR CONTROLLABLE CHIPLETS
- Publication number 20240369631
- Publication date Nov 7, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang CAI
- G01 - MEASURING TESTING
Information Patent Application
FCM BASED CHIPLET TEST CIRCUIT
- Publication number 20240288492
- Publication date Aug 29, 2024
- Nanjing University Of Posts And Telecommunications
- Zhikuang CAI
- G01 - MEASURING TESTING