TREA

Binbin YAN

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  • Eindhoven, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    Overlay metrology system and method
    • Patent number 9,329,495
    • Issue date May 3, 2016
    • GLOBALFOUNDRIES Inc.
    • Xintuo Dai
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    OVERLAY METROLOGY SYSTEM AND METHOD
    • Publication number 20150138555
    • Publication date May 21, 2015
    • GLOBALFOUNDRIES INC.
    • Xintuo DAI
    • H01 - BASIC ELECTRIC ELEMENTS