Bindu Dibbur NARASINGARAO

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan-enabled method and system for testing a system-on-chip
- Patent number 8,051,347
- Issue date Nov 1, 2011
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN-ENABLED METHOD AND SYSTEM FOR TESTING A SYSTEM-ON-CHIP
- Publication number 20110016364
- Publication date Jan 20, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G01 - MEASURING TESTING