Bing DAI

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Weifang City, Shandong, CN

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Patents Grantslast 30 patents

Information Patent Grant
Test device and calibrating method
- Patent number 11,467,053
- Issue date Oct 11, 2022
- GoerTek Inc.
- Richard Warren Little
- G01 - MEASURING TESTING
Information Patent Grant
Test device and calibrating method
- Patent number 11,187,609
- Issue date Nov 30, 2021
- GoerTek Inc.
- Richard Warren Little
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE AND CALIBRATING METHOD
- Publication number 20210223133
- Publication date Jul 22, 2021
- GOERTEK INC
- Richard Warren LITTLE
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND CALIBRATING METHOD
- Publication number 20210223135
- Publication date Jul 22, 2021
- GOERTEK INC
- Richard Warren LITTLE
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND CALIBRATING METHOD
- Publication number 20210223134
- Publication date Jul 22, 2021
- GOERTEK INC
- Richard Warren LITTLE
- G01 - MEASURING TESTING