Bing Li

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning method and apparatus for inspecting reticles
- Patent number 9,805,462
- Issue date Oct 31, 2017
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Machine learning method and apparatus for inspecting reticles
- Patent number 9,652,843
- Issue date May 16, 2017
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mesoscopic defect detection for reticle inspection
- Patent number 9,607,371
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Rui-fang Shi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning method and apparatus for inspecting reticles
- Patent number 9,430,824
- Issue date Aug 30, 2016
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 9,224,195
- Issue date Dec 29, 2015
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Grant
Detection of thin lines for selective sensitivity during reticle in...
- Patent number 9,092,847
- Issue date Jul 28, 2015
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Detection of thin lines for selective sensitivity during reticle in...
- Patent number 8,855,400
- Issue date Oct 7, 2014
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 8,718,353
- Issue date May 6, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES
- Publication number 20170221190
- Publication date Aug 3, 2017
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES
- Publication number 20160335753
- Publication date Nov 17, 2016
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
MESOSCOPIC DEFECT DETECTION FOR RETICLE INSPECTION
- Publication number 20150279014
- Publication date Oct 1, 2015
- Rui-fang Shi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...
- Publication number 20140369593
- Publication date Dec 18, 2014
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES
- Publication number 20140341462
- Publication date Nov 20, 2014
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20140205179
- Publication date Jul 24, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...
- Publication number 20130236083
- Publication date Sep 12, 2013
- KLA-Tencor Corporation
- Zhengyu Wang
- G01 - MEASURING TESTING
Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20130236084
- Publication date Sep 12, 2013
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Machine learning method and apparatus for inspecting reticles

Machine learning method and apparatus for inspecting reticles

Mesoscopic defect detection for reticle inspection

Machine learning method and apparatus for inspecting reticles

Reticle defect inspection with systematic defect filter

Detection of thin lines for selective sensitivity during reticle in...

Detection of thin lines for selective sensitivity during reticle in...

Reticle defect inspection with systematic defect filter

Patents Applicationslast 30 patents

MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES

MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES

MESOSCOPIC DEFECT DETECTION FOR RETICLE INSPECTION

DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...

MACHINE LEARNING METHOD AND APPARATUS FOR INSPECTING RETICLES

RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER

DETECTION OF THIN LINES FOR SELECTIVE SENSITIVITY DURING RETICLE IN...

RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER